Download or read book Characterization of Uranium Uranium Oxide and Silicon Multilayer Thin Films written by David T. Oliphant and published by . This book was released on 2000 with total page 79 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization of Uranium Oxide Thin Films Grown from Solution Onto Zero Valent Iron written by Siping Qiu and published by . This book was released on 2001 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization of Thin Films of Silicon Rich Oxides written by Esther Maughan and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Method of Making Thin Uranium Oxide Films on Platinum Foils written by T. Jergensen and published by . This book was released on 1946 with total page 10 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Deposition and Characterization of Silicon germanium Alloy Thin Films on Oxide written by Julie Ann Tsai and published by . This book was released on 1995 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Oxide Thin Films Multilayers and Nanocomposites written by Paolo Mele and published by Springer. This book was released on 2015-03-26 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive overview of the science of nanostructured oxides. It details the fundamental techniques and methodologies involved in oxides thin film and bulk growth, characterization and device processing, as well as heterostructures. Both, experts in oxide nanostructures and experts in thin film heteroepitaxy, contribute the interactions described within this book.

Download or read book Thermal Conductivity Measurement of Xe Implanted Uranium Dioxide Thick Films Using Multilayer Laser Flash Analysis written by and published by . This book was released on 2012 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The Fuel Cycle Research and Development program's Advanced Fuels campaign is currently pursuing use of ion beam assisted deposition to produce uranium dioxide thick films containing xenon in various morphologies. To date, this technique has provided materials of interest for validation of predictive fuel performance codes and to provide insight into the behavior of xenon and other fission gasses under extreme conditions. In addition to the structural data provided by such thick films, it may be possible to couple these materials with multilayer laser flash analysis in order to measure the impact of xenon on thermal transport in uranium dioxide. A number of substrate materials (single crystal silicon carbide, molybdenum, and quartz) containing uranium dioxide films ranging from one to eight microns in thickness were evaluated using multilayer laser flash analysis in order to provide recommendations on the most promising substrates and geometries for further investigation. In general, the uranium dioxide films grown to date using ion beam assisted deposition were all found too thin for accurate measurement. Of the substrates tested, molybdenum performed the best and looks to be the best candidate for further development. Results obtained within this study suggest that the technique does possess the necessary resolution for measurement of uranium dioxide thick films, provided the films are grown in excess of fifty microns. This requirement is congruent with the material needs when viewed from a fundamental standpoint, as this length scale of material is required to adequately sample grain boundaries and possible second phases present in ceramic nuclear fuel.

Download or read book Oxide Ultrathin Films written by Gianfranco Pacchioni and published by John Wiley & Sons. This book was released on 2012-09-19 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt: A wealth of information in one accessible book. Written by international experts from multidisciplinary fields, this in-depth exploration of oxide ultrathin films covers all aspects of these systems, starting with preparation and characterization, and going on to geometrical and electronic structure, as well as applications in current and future systems and devices. From the Contents: Synthesis and Preparation of Oxide Ultrathin Films Characterization Tools of Oxide Ultrathin Films Ordered Oxide Nanostructures on Metal Surfaces Unusual Properties of Oxides and Other Insulators in the Ultrathin Limit Silica and High-K Dielectrics Thin Films in Microelectronics Oxide Passive Films and Corrosion Protection Oxide Films as Catalytic Materials and as Models of Real Catalysts Oxide Films in Spintronics Oxide Ultrathin Films in Solid Oxide Fuel Cells Transparent Conducting and Chromogenic Oxide Films as Solar Energy Materials Oxide Ultrathin Films in Sensor Applications Ferroelectricity in Ultrathin Film Capacitors Titania Thin Films in Biocompatible Materials and Medical Implants Oxide Nanowires for New Chemical Sensor Devices

Download or read book Electrical Characterization of Silicon Dioxide and Silicon Oxynitride Thin Films written by April Tai and published by . This book was released on 2006 with total page 134 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microstructural Characterization of Uranium Oxide written by and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Thin Films and Heterostructures for Oxide Electronics written by Satishchandra B. Ogale and published by Springer Science & Business Media. This book was released on 2005-11-21 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt: Oxides form a broad subject area of research and technology development which encompasses different disciplines such as materials science, solid state chemistry, physics etc. The aim of this book is to demonstrate the interplay of these fields and to provide an introduction to the techniques and methodologies involving film growth, characterization and device processing. The literature in this field is thus fairly scattered in different research journals covering one or the other aspect of the specific activity. This situation calls for a book that will consolidate this information and thus enable a beginner as well as an expert to get an overall perspective of the field, its foundations, and its projected progress.

Download or read book Growth and Characterization of Undoped and Doped Silicon Thin Films Using Supersonic Molecular Jets written by Rajeev Malik and published by . This book was released on 1996 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization of Diamond Thin Films Grown on Silicon Substrates written by Kiam Meng Tey and published by . This book was released on 1995 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Synthesis and Characterization of Silicon Dioxide Thin Films by Low Pressure Chemical Vapor Deposition written by Sutham Niyomwas and published by . This book was released on 1997 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 692 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metal Oxide Based Thin Film Structures written by Nini Pryds and published by . This book was released on 2017 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ion Beam based Characterization of Multicomponent Oxide Thin Films and Thin Film Layered Structures written by and published by . This book was released on 1992 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fabrication of thin film layered structures of multi-component materials such as high temperature superconductors, ferroelectric and electro-optic materials, and alloy semiconductors, and the development of hybrid materials requires understanding of film growth and interface properties. For High Temperature Superconductors, the superconducting coherence length is extremely short (5--15 [Angstrom]), and fabrication of reliable devices will require control of film properties at extremely sharp interfaces; it will be necessary to verify the integrity of thin layers and layered structure devices over thicknesses comparable to the atomic layer spacing. Analytical techniques which probe the first 1--2 atomic layers are therefore necessary for in-situ characterization of relevant thin film growth processes. However, most surface-analytical techniques are sensitive to a region within 10--40 [Angstrom] of the surface and are physically incompatible with thin film deposition and are typically restricted to ultra high vacuum conditions. A review of ion beam-based analytical methods for the characterization of thin film and multi-layered thin film structures incorporating layers of multicomponent oxides is presented. Particular attention will be paid to the use of time-of-flight techniques based on the use of 1- 15 key ion beams which show potential for use as nondestructive, real-time, in-situ surface diagnostics for the growth of multicomponent metal and metal oxide thin films.