Download or read book Bulk Silicon germanium Heterojunction Bipolar Transistor Process Feature Implications for Single event Effects Analysis and Charge Collection Mechanisms written by Jonathan Allen Pellish and published by . This book was released on 2008 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advanced Modeling of Silicon Germanium Heterojunction Bipolar Transistors written by Andreas Pawlak and published by Tudpress Verlag Der Wissenschaften Gmbh. This book was released on 2015-10-14 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon-Germanium Heterojunction Bipolar Transistors (SiGe HBTs) are perfectly suited for high-speed electronics. Since the fabrication costs per design cycle are rapidly increasing with progressing frequency and complexity of the systems, accurate compact models are essential in order to enable robust circuit design. This thesis focuses on selected important physical effects in advanced SiGe HBTs, which have been either insufficiently modeled or completely missing in conventional compact models. New compact model equations for the transfer current were derived and successfully applied to a large set of different technologies. Hereby, the "Generalized Integral Charge Control Relation" was used as a foundation. A physics-based model utilizing small-signal parameters obtained from measurements is derived for modeling the current dependent collector charge. A brief chapter about substrate effects in bipolar transistors comprises the derivation of a compact model for the bias-dependent substrate resistance as well as a proper partitioning of the substrate capacitance. New extraction methods for compact model parameters are introduced and the application of existing methods to advanced processes is discussed. The derived joint extraction method for the emitter and thermal resistance as well as a scalable model for the transfer current have been successfully applied to experimental data of fast HBTs. The derived model equations were applied to a selected very advanced SiGe HBT process developed by IHP. Highly accurate models for DC- and small-signal as well as for large-signal characteristics are presented.
Download or read book Impact of Charge Collection Mechanisms on Single Event Effects in SiGe HBT Circuits written by and published by . This book was released on 2009 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Mixed mode Reliability Stress of Silicon germanium Heterojunction Bipolar Transistors written by Chendong Zhu and published by . This book was released on 2007 with total page 101 pages. Available in PDF, EPUB and Kindle. Book excerpt: This dissertation covers the following topics: (1) Introduces a new mixed-mode stress technique: time cumulative stress (Chapter II, also published in [23] and [24]). (2) Identifies impact ionization effects in the stress damage (Chapter II, also published in [23] and [24]). (3) Investigates for the first time mixed-mode damage using TCAD simulations at both room temperature and cryogenic temperatures (Chapter III and IV, also published in [23][24][62]). (4) Analyzes for the first time impact of self-heating on mixed-mode stress response, and identifies a temperature triggered damage threshold (Chapter II, will be published in [25]). (5) Explains the geometrical scaling issues in mixed-mode stress and explores mixed-mode stress reliability scaling trends (Chapter II, will be published in [25]). (6) Assesses for the first time SiGe HBT reliability at cryogenic temperatures (Chapter VI, also published in [62]).
Download or read book Silicon Germanium Heterojunction Bipolar Transistors for MM Wave Systems Technology Modeling and Circuit Applications written by Niccolò Rinaldi and published by . This book was released on 2024-10-21 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon-Germanium Heterojunction Bipolar Transistors for mm-Wave Systems Technology, Modeling and Circuit Applications provides an overview of results of the DOTSEVEN EU research project, and as such focusses on key material developments for mm-Wave Device Technology.
Download or read book Silicon Germanium Heterojunction Bipolar Transistors written by Jessica E. Metcalfe and published by . This book was released on 2006 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Operation of Silicon germanium Heterojunction Bipolar Transistors on written by Marco Bellini and published by . This book was released on 2009 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Recently, several SiGe HBT devices fabricated on CMOS-compatible silicon on insulator (SOI) substrates (SiGe HBTs-on-SOI) have been demonstrated, combining the well-known SiGe HBT performance with the advantages of SOI substrates. These new devices are especially interesting in the context of extreme environments - highly challenging surroundings that lie outside commercial and even military electronics specifications. However, fabricating HBTs on SOI substrates instead of traditional silicon bulk substrates requires extensive modifications to the structure of the transistors and results in significant trade-offs. The present work investigates, with measurements and TCAD simulations, the performance and reliability of SiGe heterojunction bipolar transistors fabricated on silicon on insulator substrates with respect to operation in extreme environments such as at extremely low or extremely high temperatures or in the presence of radiation (both in terms of total ionizing dose and single effect upset).
Download or read book Displacement Damage and Ionization Effects in Advanced Silicon germanium Heterojunction Bipolar Transistors written by Akil K. Sutton and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A summary of total dose effects observe in advanced Silicon Germanium (SiGe) Heterojunction Bipolar Transistors (HBTs) is presented in this work. The principal driving froces behind the increased use of SiGe BiCMOS technology in space based electronics systems are outlined in the motivation Section of Chapter I. This is followed by a discussion of the strained layer Si/SiGe material structure and relevant fabrication techniques used in the development of the first generation of this technology. A comprehensive description of the device performance is presented. Chapter II presents an overview of radiation physics as it applies to microelectronic devices. Several sources of radiation are discussed including the environments encountered by satellites in different orbital paths around the earth. The particle types, interaction mechanisms and damage nomenclature are described. Proton irradiation experiments to analyze worst case displacement and ionization damage are examined in chapter III. A description of the test conditions is first presented, followed by the experimental results on the observed dc and ac transistor performance metrics with incident radiation. The impact of the collector doping level on the degradation is discussed. In a similar fashion, gamma irradiation experiments to focus on ionization only effects are presented in chapter IV. The experimental design and dc results are first presented, followed by a comparison of degradation under proton irradiation. Additional proton dose rate experiments conducted to further investigate observed differences between proton and gamma results are presented.
Download or read book Silicon Germanium Heterojunction Bipolar Transistors written by Staffan Bruce and published by . This book was released on 1999 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Substrate Engineering Techniques to Mitigate Radiation induced Charge Collection in Silicon Germanium Heterojunction Bipolar Transistors written by Jonathan Allen Pellish and published by . This book was released on 2006 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Study of Low temperature Effects in Silicon germanium Heterojunction Bipolar Transistor Technology written by Adnan Ahmed and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis investigates the effects of low temperatures on Silicon Germanium (SiGe) Hterojunction Bipolar Transistors (HBT) BiCMOS technology. A comprehensive set of dc measurements were taken on first, second, third and fourth generation IBM SiGe technology over a range of temperatures (room temperature to 43K for first generation, and room temperature to 15K for the rest). This work is unique in the sense that this sort of comprehensive study of dc characteristics on four SiGe HBT technology generations over a wide range of temperatures has never been done before to the best of the author's knowledge.
Download or read book Physics Briefs written by and published by . This book was released on 1990 with total page 1048 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Performance Prediction of a Future Silicon germanium Heterojunction Bipolar Transistor Technology Using a Heterogeneous Set of Simulation Tools and Approaches written by Tommy Rosenbaum and published by . This book was released on 2017 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Bipolar complementary metal-oxide-semiconductor (BiCMOS) processescan be considered as the most general solution for RF products, as theycombine the mature manufacturing tools of CMOS with the speed and drivecapabilities of silicon-germanium (SiGe) heterojunction bipolar transistors(HBTs). HBTs in turn are major contenders for partially filling the terahertzgap, which describes the range in which the frequencies generated bytransistors and lasers do not overlap (approximately 0.3THz to 30 THz). Toevaluate the capabilities of such future devices, a reliable prediction methodologyis desirable. Using a heterogeneous set of simulation tools and approachesallows to achieve this goal successively and is beneficial for troubleshooting.Various scientific fields are combined, such as technology computer-aided design(TCAD), compact modeling and parameter extraction.To create a foundation for the simulation environment and to ensure reproducibility,the used material models of the hydrodynamic and drift-diffusionapproaches are introduced in the beginning of this thesis. The physical modelsare mainly based on literature data of Monte Carlo (MC) or deterministicsimulations of the Boltzmann transport equation (BTE). However, the TCADdeck must be calibrated on measurement data too for a reliable performanceprediction of HBTs. The corresponding calibration approach is based onmeasurements of an advanced SiGe HBT technology for which a technology specific parameter set of the HICUM/L2 compact model is extracted for thehigh-speed, medium-voltage and high-voltage transistor versions. With thehelp of the results, one-dimensional transistor characteristics are generatedthat serve as reference for the doping profile and model calibration. By performingelaborate comparisons between measurement-based reference dataand simulations, the thesis advances the state-of-the-art of TCAD-based predictionsand proofs the feasibility of the approach.Finally, the performance of a future technology in 28nm is predicted byapplying the heterogeneous methodology. On the basis of the TCAD results,bottlenecks of the technology are identified.
Download or read book Radiation and Strain Effects in Silicon germanium Bipolar Complementary Metal Oxide Semiconductor Technology written by Becca Mary Haugerud and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This work examines the effects of radiation and strain on silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) BiCMOS technology. First, aspects of the various SiGe HBT BiCMOS technologies and the device physics of the SiGe HBT are discussed. The performance advantages of the SiGe HBT over the Si BJT are also presented. Chapter II offers a basic introduction to key radiation concepts. The space radiation environment as well as the two common radiation damage mechanisms are described. An overview of the effects of radiation damage on Si-based semiconductor devices, namely bipolar and CMOS, is also presented. Next, the effects of proton and gamma radiation on a new first-generation SiGe HBT technology are investigated. The results of a differential SiGe HBT LC oscillator subjected to proton irradiation are also presented as a test of circuit-level radiation tolerance. Finally, a technology comparison is made between the results of this work and the three different previously reported SiGe technologies. All reported SiGe HBT technologies to date show acceptable proton radiation tolerance up to Mrad levels. Chapter IV investigates the effects of effects of mechanical planar biaxial strain in SiGe HBT BiCMOS technology. This novel strain method is applied post fabrication, unlike many other straining methods. We report increases in the nFET saturated drain current, transconductance, and effective mobility for an applied strain of 0.123%. The pFET device performance degrades for this type of low-level strain.
Download or read book Charge Collection Mechanisms in Silicon Devices During High level Carrier Generation Events written by Nicholas C. Hooten and published by . This book was released on 2014 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Single Event Effects and Radiation Hardening Methodologies in SiGe HBTs for Extreme Environment Applications written by Stanley David Phillips and published by . This book was released on 2012 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Field-effect transistor technologies have been critical building blocks for satellite systems since their introduction into the microelectronics industry. The extremely high cost of launching payloads into orbit necessitates systems to have small form factor, ultra low-power consumption, and reliable lifetime operation, while satisfying the performance requirements of a given application. Silicon-based complementary metal-oxide-semiconductors (Si CMOS) have traditionally been able to adequately meet these demands when coupled with radiation hardening techniques that have been developed over years of invested research. However, as customer demands increase, pushing the limits of system throughput, noise, and speed, alternative technologies must be employed. Silicon-germanium BiCMOS platforms have been identfied as a technology candidate for meeting the performance criteria of these pioneering satellite systems and deep space applications, contingent on their ability to be hardened to radiation-induced damage. Given that SiGe technology is a relative new- comer to terrestrial and extra-terrestrial applications in radiation-rich environments, the same wealth of knowledge of time-tested radiation hardening methodologies has not been established as it has for Si CMOS. Although SiGe BiCMOS technology has been experimentally proven to be inherently tolerant to total-ionizing dose damage mechanism, the single event susceptibility of this technology remains a primary concern. The objective of this research is to characterize the physical mechanisms that drive the origination of ion-induced transient terminal currents in SiGe HBTs that subsequently lead to a wide range of possible single event phenomena. Building upon this learning, a variety of device-level hardening methodologies are explored and tested for efficacy.
Download or read book Charge Carrier Transport in Silicon germanium Heterojunction Bipolar Transistors written by Raymond Josephus Engelbart Hueting and published by . This book was released on 1997 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt:
