Download or read book A Designer s Guide to Built In Self Test written by Charles E. Stroud and published by Springer Science & Business Media. This book was released on 2005-12-27 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Download or read book The Test Access Port and Boundary scan Architecture written by Colin M. Maunder and published by . This book was released on 1990 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Dependable Computing EDDC 3 written by Jan Hlavicka and published by Springer. This book was released on 2003-06-26 with total page 442 pages. Available in PDF, EPUB and Kindle. Book excerpt: The idea of creating the European Dependable Computing Conference (EDCC) was born at the moment when the Iron Curtain fell. A group of enthusiasts, who were pre viously involved in research and teaching in the ?eld of fault tolerant computing in different European countries, agreed that there is no longer any point in keeping pre viously independent activities apart and created a steering committee which took the responsibility for preparing the EDCC calendar and appointing the chairs for the in dividual conferences. There is no single European or global professional organization that took over the responsibility for this conference, but there are three national in terest groups that sent delegates to the steering committee and support its activities, especially by promoting the conference materials. As can be seen from these materi als, they are the SEE Working Group “Dependable Computing” (which is a successor organizationof AFCET)in France,theGI/ITG/GMATechnicalCommitteeonDepend ability and Fault Tolerance in Germany, and the AICA Working Group “Dependability of Computer Systems” in Italy. In addition, committees of several global professional organizations, such as IEEE and IFIP, support this conference. Prague has been selected as a conference venue for several reasons. It is an easily accessible location that may attract many visitors by its beauty and that has a tradition in organizing international events of this kind (one of the last FTSD conferences took place here).
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Download or read book Electronic Design Automation written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2009-03-11 with total page 971 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. - Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly - Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence - Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products - Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes
Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Download or read book Digital Design VHDL written by Peter J. Ashenden and published by Elsevier. This book was released on 2007-10-24 with total page 595 pages. Available in PDF, EPUB and Kindle. Book excerpt: Digital Design: An Embedded Systems Approach Using VHDL provides a foundation in digital design for students in computer engineering, electrical engineering and computer science courses. It takes an up-to-date and modern approach of presenting digital logic design as an activity in a larger systems design context. Rather than focus on aspects of digital design that have little relevance in a realistic design context, this book concentrates on modern and evolving knowledge and design skills. Hardware description language (HDL)-based design and verification is emphasized--VHDL examples are used extensively throughout. By treating digital logic as part of embedded systems design, this book provides an understanding of the hardware needed in the analysis and design of systems comprising both hardware and software components. Includes a Web site with links to vendor tools, labs and tutorials. - Presents digital logic design as an activity in a larger systems design context - Features extensive use of VHDL examples to demonstrate HDL (hardware description language) usage at the abstract behavioural level and register transfer level, as well as for low-level verification and verification environments - Includes worked examples throughout to enhance the reader's understanding and retention of the material - Companion Web site includes links to tools for FPGA design from Synplicity, Mentor Graphics, and Xilinx, VHDL source code for all the examples in the book, lecture slides, laboratory projects, and solutions to exercises
Download or read book The Boundary Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the integrated circuit (IC) level that allow software to alleviate the growing cost of designing and producing digital systems. The primary benefit of the standard is its ability to transform extremely printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily and swiftly deal with. The Boundary-Scan Handbook is for professionals in the electronics industry who are concerned with the practical problems of competing successfully in the face of rapid-fire technological change. Since many of these changes affect our ability to do testing and hence cost-effective production, the advent of the 1149.1 standard is rightly looked upon as a major breakthrough. However, there is a great deal of misunderstanding about what to expect of 1149.1 and how to use it. Because of this, The Boundary-Scan Handbook is not a rehash of the 1149.1 standard, nor does it intend to be a tutorial on the basics of its workings. The standard itself should always be consulted for this, being careful to follow supplements issued by the IEEE that clarify and correct it. Rather, The Boundary-Scan Handbook motivates proper expectations and explains how to use the standard successfully.
Download or read book A Practical Approach to VLSI System on Chip SoC Design written by Veena S. Chakravarthi and published by Springer Nature. This book was released on 2022-12-13 with total page 355 pages. Available in PDF, EPUB and Kindle. Book excerpt: Now in a thoroughly revised second edition, this practical practitioner guide provides a comprehensive overview of the SoC design process. It explains end-to-end system on chip (SoC) design processes and includes updated coverage of design methodology, the design environment, EDA tool flow, design decisions, choice of design intellectual property (IP) cores, sign-off procedures, and design infrastructure requirements. The second edition provides new information on SOC trends and updated design cases. Coverage also includes critical advanced guidance on the latest UPF-based low power design flow, challenges of deep submicron technologies, and 3D design fundamentals, which will prepare the readers for the challenges of working at the nanotechnology scale. A Practical Approach to VLSI System on Chip (SoC) Design: A Comprehensive Guide, Second Edition provides engineers who aspire to become VLSI designers with all the necessary information and details of EDA tools. It will be a valuable professional reference for those working on VLSI design and verification portfolios in complex SoC designs
Download or read book Digital Design Verilog written by Peter J. Ashenden and published by Elsevier. This book was released on 2007-10-24 with total page 579 pages. Available in PDF, EPUB and Kindle. Book excerpt: Digital Design: An Embedded Systems Approach Using Verilog provides a foundation in digital design for students in computer engineering, electrical engineering and computer science courses. It takes an up-to-date and modern approach of presenting digital logic design as an activity in a larger systems design context. Rather than focus on aspects of digital design that have little relevance in a realistic design context, this book concentrates on modern and evolving knowledge and design skills. Hardware description language (HDL)-based design and verification is emphasized--Verilog examples are used extensively throughout. By treating digital logic as part of embedded systems design, this book provides an understanding of the hardware needed in the analysis and design of systems comprising both hardware and software components. Includes a Web site with links to vendor tools, labs and tutorials. - Presents digital logic design as an activity in a larger systems design context - Features extensive use of Verilog examples to demonstrate HDL (hardware description language) usage at the abstract behavioural level and register transfer level, as well as for low-level verification and verification environments - Includes worked examples throughout to enhance the reader's understanding and retention of the material - Companion Web site includes links to tools for FPGA design from Synplicity, Mentor Graphics, and Xilinx, Verilog source code for all the examples in the book, lecture slides, laboratory projects, and solutions to exercises
Download or read book Design for Testability Debug and Reliability written by Sebastian Huhn and published by Springer Nature. This book was released on 2021-04-19 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Download or read book Hardware Security written by Swarup Bhunia and published by Morgan Kaufmann. This book was released on 2018-10-30 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardware Security: A Hands-On Learning Approach provides a broad, comprehensive and practical overview of hardware security that encompasses all levels of the electronic hardware infrastructure. It covers basic concepts like advanced attack techniques and countermeasures that are illustrated through theory, case studies and well-designed, hands-on laboratory exercises for each key concept. The book is ideal as a textbook for upper-level undergraduate students studying computer engineering, computer science, electrical engineering, and biomedical engineering, but is also a handy reference for graduate students, researchers and industry professionals. For academic courses, the book contains a robust suite of teaching ancillaries. Users will be able to access schematic, layout and design files for a printed circuit board for hardware hacking (i.e. the HaHa board) that can be used by instructors to fabricate boards, a suite of videos that demonstrate different hardware vulnerabilities, hardware attacks and countermeasures, and a detailed description and user manual for companion materials. - Provides a thorough overview of computer hardware, including the fundamentals of computer systems and the implications of security risks - Includes discussion of the liability, safety and privacy implications of hardware and software security and interaction - Gives insights on a wide range of security, trust issues and emerging attacks and protection mechanisms in the electronic hardware lifecycle, from design, fabrication, test, and distribution, straight through to supply chain and deployment in the field - A full range of instructor and student support materials can be found on the authors' own website for the book: http://hwsecuritybook.org
Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Morgan & Claypool Publishers. This book was released on 2009 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Download or read book Design for AT Speed Test Diagnosis and Measurement written by Benoit Nadeau-Dostie and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Download or read book Official Gazette of the United States Patent and Trademark Office written by United States. Patent and Trademark Office and published by . This book was released on 2000 with total page 1076 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Circuit Designer s Companion written by Peter Wilson and published by Elsevier. This book was released on 2012-01-12 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: Grounding and Wiring; Printed Circuits -- Passive Components -- Active Components -- Analog Integrated Circuits -- Digital Circuits; Power Supplies -- Electromagnetic Compatibility -- General Product Design -- Appendices.
