Download or read book Boundary Scan Interconnect Diagnosis written by José T. de Sousa and published by Springer Science & Business Media. This book was released on 2005-12-28 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: This pioneering text explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. It takes a new approach, carefully modelling circuit and interconnect faults, and applying graph techniques to solve problems.
Download or read book Design for AT Speed Test Diagnosis and Measurement written by Benoit Nadeau-Dostie and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Download or read book Multi Chip Module Test Strategies written by Yervant Zorian and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Download or read book Official Gazette of the United States Patent and Trademark Office written by and published by . This book was released on 1996 with total page 934 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test and Measurement Know It All written by Jon S. Wilson and published by Newnes. This book was released on 2008-09-26 with total page 910 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!Field Application engineers need to master a wide area of topics to excel. The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing. - A 360-degree view from our best-selling authors - Topics include the Technology of Test and Measurement, Measurement System Types, and Instrumentation for Test and Measurement - The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume
Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Download or read book Design of Systems on a Chip Design and Test written by Ricardo Reis and published by Springer Science & Business Media. This book was released on 2007-05-06 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.
Download or read book Computational Science and Its Applications ICCSA 2006 written by Osvaldo Gervasi and published by Springer. This book was released on 2006-05-11 with total page 1217 pages. Available in PDF, EPUB and Kindle. Book excerpt: The five-volume set LNCS 3980-3984 constitutes the refereed proceedings of the International Conference on Computational Science and Its Applications, ICCSA 2006. The volumes present a total of 664 papers organized according to the five major conference themes: computational methods, algorithms and applications high performance technical computing and networks advanced and emerging applications geometric modelling, graphics and visualization information systems and information technologies. This is Part IV.
Download or read book Digest of Papers Compcon written by and published by . This book was released on 1992 with total page 530 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Download or read book Proceedings of the European Test Conference written by and published by . This book was released on 1991 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings written by and published by . This book was released on 1993 with total page 774 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings International Test Conference 1997 written by and published by . This book was released on 1997 with total page 1074 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Conference Proceedings written by and published by . This book was released on 1994 with total page 996 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electro 94 International written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1994 with total page 998 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2003 with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI System Test written by and published by . This book was released on 1990 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:
