Download or read book Automatic Test Pattern Generation for Logic Circuits Using the Boolean Tree written by Taegwon Jeong and published by . This book was released on 1991 with total page 244 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test Pattern Generation using Boolean Proof Engines written by Rolf Drechsler and published by Springer. This book was released on 2010-10-19 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Download or read book Reasoning in Boolean Networks written by Wolfgang Kunz and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. The book presents the central idea of approaching design automation problems for logic-level circuits by specific Boolean reasoning techniques. While Boolean reasoning techniques have been a central element of two-level circuit theory for many decades Reasoning in Boolean Networks describes a basic reasoning methodology for multi-level circuits. This leads to a unified view on two-level and multi-level logic synthesis. The presented reasoning techniques are applied to various CAD-problems to demonstrate their usefulness for today's industrially relevant problems. Reasoning in Boolean Networks provides lucid descriptions of basic algorithmic concepts in automatic test pattern generation, logic synthesis and verification and elaborates their intimate relationship to provide further intuition and insight into the subject. Numerous examples are provide for ease in understanding the material. Reasoning in Boolean Networks is intended for researchers in logic synthesis, VLSI testing and formal verification as well as for integrated circuit designers who want to enhance their understanding of basic CAD methodologies.
Download or read book Automatic test pattern generation for combinational logic using the Boolean difference technique with binary decision diagrams written by Steve McMahan and published by . This book was released on 1987 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Logic Synthesis and Verification written by Soha Hassoun and published by Springer Science & Business Media. This book was released on 2001-11-30 with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research and development of logic synthesis and verification have matured considerably over the past two decades. Many commercial products are available, and they have been critical in harnessing advances in fabrication technology to produce today's plethora of electronic components. While this maturity is assuring, the advances in fabrication continue to seemingly present unwieldy challenges. Logic Synthesis and Verification provides a state-of-the-art view of logic synthesis and verification. It consists of fifteen chapters, each focusing on a distinct aspect. Each chapter presents key developments, outlines future challenges, and lists essential references. Two unique features of this book are technical strength and comprehensiveness. The book chapters are written by twenty-eight recognized leaders in the field and reviewed by equally qualified experts. The topics collectively span the field. Logic Synthesis and Verification fills a current gap in the existing CAD literature. Each chapter contains essential information to study a topic at a great depth, and to understand further developments in the field. The book is intended for seniors, graduate students, researchers, and developers of related Computer-Aided Design (CAD) tools. From the foreword: "The commercial success of logic synthesis and verification is due in large part to the ideas of many of the authors of this book. Their innovative work contributed to design automation tools that permanently changed the course of electronic design." by Aart J. de Geus, Chairman and CEO, Synopsys, Inc.
Download or read book Logic Verification and Test Generation for VLSI Circuits written by Ruey-sing Wei and published by . This book was released on 1986 with total page 548 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electronic Design Automation for IC System Design Verification and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Download or read book The Automatic Test Pattern Generation in the Logic Gate Level Circuits and MOS Transistor Circuits at Ohio University written by Hoon-Kyeu Lee and published by . This book was released on 1986 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book A Study of Automatic Test Pattern Generation Systems written by Kyuchull Kim and published by . This book was released on 1992 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Communication and Computing Systems written by B.M.K. Prasad and published by CRC Press. This book was released on 2017-02-15 with total page 1551 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a collection of accepted papers that were presented at the International Conference on Communication and Computing Systems (ICCCS-2016), Dronacharya College of Engineering, Gurgaon, September 9–11, 2016. The purpose of the conference was to provide a platform for interaction between scientists from industry, academia and other areas of society to discuss the current advancements in the field of communication and computing systems. The papers submitted to the proceedings were peer-reviewed by 2-3 expert referees. This volume contains 5 main subject areas: 1. Signal and Image Processing, 2. Communication & Computer Networks, 3. Soft Computing, Intelligent System, Machine Vision and Artificial Neural Network, 4. VLSI & Embedded System, 5. Software Engineering and Emerging Technologies.
Download or read book EDA for IC System Design Verification and Testing written by Louis Scheffer and published by CRC Press. This book was released on 2018-10-03 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.
Download or read book Test and Diagnosis for Small Delay Defects written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2011-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Download or read book Test Generation for Boolean Expressions and Combinational Logic Circuits written by Hsun-Kang Su and published by . This book was released on 1989 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by John Wiley & Sons. This book was released on 2003-10-24 with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt: Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Download or read book Test Pattern Generation for Combinational Logic Circuits Using Fan Algorithm written by Ravishanker Venkata Nandiwada and published by . This book was released on 1992 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
