Download or read book Automated Procedures for Characterizing Specific Equipment Productivity Losses with Applications in the Semiconductor Manufacturing Industry written by David Paul Busing and published by . This book was released on 1998 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Dissertation Abstracts International written by and published by . This book was released on 1999 with total page 700 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Learning by Using in Semiconductor Manufacturing written by Paolo Palezzato and published by . This book was released on 2000 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book American Doctoral Dissertations written by and published by . This book was released on 1998 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Analytical Techniques for Semiconductor Materials and Process Characterization 6 ALTECH 2009 written by Bernd O. Kolbesen and published by The Electrochemical Society. This book was released on 2009-09 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.
Download or read book University of Michigan Official Publication written by University of Michigan and published by UM Libraries. This book was released on 2000 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: Each number is the catalogue of a specific school or college of the University.
Download or read book Proceedings written by and published by . This book was released on 1988 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 1990 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI System Test written by and published by . This book was released on 1990 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book College of Engineering University of Michigan Publications written by University of Michigan. College of Engineering and published by . This book was released on 2002 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Also contains brochures, directories, manuals, and programs from various College of Engineering student organizations such as the Society of Women Engineers and Tau Beta Pi.
Download or read book Integrated Circuit Metrology Inspection and Process Control V written by William H. Arnold and published by SPIE-International Society for Optical Engineering. This book was released on 1991 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Bureau of Standards 1986 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1987 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Machine Vision Applications in Industrial Inspection written by and published by . This book was released on 1997 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Guide to NIST National Institute of Standards and Technology written by DIANE Publishing Company and published by DIANE Publishing. This book was released on 1997-07 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gathers in one place descriptions of NIST's many programs, products, services, and research projects, along with contact names, phone numbers, and e-mail and World Wide Web addresses for further information. It is divided into chapters covering each of NIST's major operating units. In addition, each chapter on laboratory programs includes subheadings for NIST organizational division or subject areas. Covers: electronics and electrical engineering; manufacturing engineering; chemical science and technology; physics; materials science and engineering; building and fire research and information technology.
Download or read book Integrated Circuit Metrology Inspection and Process Control written by and published by . This book was released on 1991 with total page 654 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Applied Computer Sciences in Engineering written by Juan Carlos Figueroa-García and published by Springer. This book was released on 2018-09-12 with total page 635 pages. Available in PDF, EPUB and Kindle. Book excerpt: This two-volume set (CCIS 915 and CCIS 916) constitutes the refereed proceedings of the 5th Workshop on Engineering Applications, WEA 2018, held in Medellín, Colombia, in October 2018. The 50 revised full papers presented in this volume were carefully reviewed and selected from126 submissions. The papers are organized in topical sections such as computer science; computational intelligence; simulation systems; software engineering; power and energy applications.
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
