Download or read book Auger Electron Spectroscopy Reference Manual written by G. McGuire and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt: Auger electron spectroscopy (AES) is based on the Auger total secondary electron energy distribution, and an ion gun to process, which involves the core-level ionization of an atom with provide depth profiling capability. subsequent deexcitation occurring by an outer-level electron de The high surface sensitivity of Auger spectroscopy which dictates caying to fill the core hole. The excess energy is transferred to the need for an ultrahigh-vacuum system is due to the limited and causes the ejection of another electron, which is by definition mean free path of electrons in the 0-3000 e V kinetic energy an Auger electron. The Auger electron transition, denoted by range. The Auger peaks decay exponentially with overlayer cov the electron levels involved, is independent of the excitation erage, which is consistent with an exponential dependence of source and leaves the atom with a constant kinetic energy. The escape probability on the depth of the parent atom. A compila kinetic energy is given by the differences in binding energies for tion of data from a variety of sources has been used to generate the three levels (for example, EK-E L, - EL ) minus a correction 2 an escape depth curve which falls in the range of 5-30 A in the term for the work function and electron wave function relaxation. energy range from 0 to 3000 eV. The observed escape depth does When the Auger transition occurs within a few angstroms of the not show a strong dependence on the matrix.
Download or read book Handbook of Auger Electron Spectroscopy written by Paul William Palmberg and published by . This book was released on 1972 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook of auger electron spectroscopy a reference book standard data for identification and interpretation of auger electron spectroscopy data written by Lawrence E. Davis and published by . This book was released on 1976 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Auger Electron Spectroscopy written by Michael Thompson and published by Wiley-Interscience. This book was released on 1985 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Download or read book Data Driven Guide to the Analysis of X ray Photoelectron Spectra using RxpsG written by Giorgio Speranza and published by CRC Press. This book was released on 2023-11-23 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a theoretical background to X-ray photoelectron spectroscopy (XPS) and a practical guide to the analysis of the XPS spectra using the RxpsG software, a powerful tool for XPS analysis. Although there are several publications and books illustrating the theory behind XPS and the origin of the spectral feature, this book provides an additional practical introduction to the use of RxpsG. It illustrates how to use the RxpsG software to perform specific key operations, with figures and examples which readers can reproduce themselves. The book contains a list of theoretical sections explaining the appearance of the various spectral features (core‐lines, Auger components, valence bands, loss features, etc.). They are accompanied by practical steps, so readers can learn how to analyze specific spectral features using the various functions of the RxpsG software. This book is a useful guide for researchers in physics, chemistry, and material science who are looking to begin using XPS, in addition to experienced researchers who want to learn how to use RxpsG. In the digital format, the spectral data and step-by-step indications are provided to reproduce the examples given in the textbook. RxpsG is a free software for the spectral analysis. Readers can find the installation information and download the package from https://github.com/GSperanza/ website. RxpsG was developed mainly by Giorgio Speranza with the help of his colleague dr. Roberto Canteri working at Fondazione Bruno Kessler. Key Features: Simplifies the use of RxpsG, how it works, and its applications. Demonstrates RxpsG using a reproduction of the graphical interface of RxpsG, showing the steps needed to perform a specific task and the effect on the XPS spectra. Accessible to readers without any prior experience using the RxpsG software. Giorgio Speranza is Senior Researcher at Fondazione Bruno Kessler – Trento Italy, Associate Member of the Italian National Council of Research, and Associate Member of the Department of Industrial Engineering at the University of Trento, Italy.
Download or read book Microanalysis of Solids written by B.G. Yacobi and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 459 pages. Available in PDF, EPUB and Kindle. Book excerpt: The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 ~m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences.
Download or read book Photoelectron and Auger Spectroscopy written by T. A. Carlson and published by . This book was released on 1978 with total page 417 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook of Surface and Interface Analysis written by John C. Riviere and published by CRC Press. This book was released on 2009-06-24 with total page 671 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Download or read book Practical Guide to Materials Characterization written by Khalid Sultan and published by John Wiley & Sons. This book was released on 2022-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Guide to Materials Characterization Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner. To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements. Specific sample topics covered in the remaining seven chapters include: Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM) With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.
Download or read book Recent Advances in Trace Elements written by Katarzyna Chojnacka and published by John Wiley & Sons. This book was released on 2018-02-23 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive and multidisciplinary presentation of the current trends in trace elements for human, animals, plants, and the environment This reference provides the latest research into the presence, characterization, and applications of trace elements and their role in humans, animals, and plants as well as their use in developing novel, functional feeds, foods, and fertilizers. It takes an interdisciplinary approach to the subject, describing the biological and industrial applications of trace elements. It covers various topics, such as the occurrence, role, and monitoring of trace elements and their characterization, as well as applications from the preliminary research to laboratory trials. Recent Advances in Trace Elements focuses on the introduction and prospects of trace elements; tackles environmental aspects such as sources of emission, methods of monitoring, and treatment/remediation processes; goes over the biological role of trace elements in plants, animals, and human organisms; and discusses the relevance of biomedical applications and commercialization. A compendium of recent knowledge in interdisciplinary trace element research Uniquely covers production and characterization of trace elements, as well as the industrial and biomedical aspects of their use Paves the way for the development of innovative products in diverse fields, including pharmaceuticals, food, environment, and materials science Edited by well-known experts in the field of trace elements with contributions from international specialists from a wide range of areas Unique in presenting comprehensive and multidisciplinary information of the key aspects of trace elements research in a digestible form, this book is essential reading for the novice and expert in the fields of environmental science, analytical chemistry, biochemistry, materials science, pharmaceutical science, nutraceutical, and pharmaceutical sciences. It is also valuable for companies that implement new products incorporating trace elements to the market.
Download or read book Auger Electron Spectroscopy written by Donald T. Hawkins and published by . This book was released on 1977-02 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Solar Energy written by Karl W. Boer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Solar Energy is back on schedule. Volume III contains a number of interesting reviews of the different fields in solar energy conversion. We appreciate the many encouraging comments received after the second volume appeared and have incorporated some of the suggested changes. Even though most of the reviews are invited through our editors, we are always open to suggestion about subjects of importance that are ready for a com prehensive and critical review and have not been recently covered, or about potential authors. I would like to take this opportunity to thank Professor John A. Duffie for his invaluable help in starting the Advances in Solar Energy series. Although he has recently taken full responsibility as editor-in-chief for the Solar Energy Journal, his continued assistance as a member of the Board of Editors is greatly appreciated. The diligent work of the many active editors is gratefully acknowledged and constitutes the basis for a valuable review periodical with outstanding contributions. The typesetting was done by Sandra Pruitt in the Delaware office, using the TEX-program with laser print-out. Her organization and patience in coordinating with the authors, and her technical skill and diligence in preparing the submitted copy permitted the timely and high-quality assembly of this production. We wish to commend her for efforts well beyond the call of duty. The accommodating help from Plenum Press and its production staff deserves our grateful acknowledgement.
Download or read book Springer Handbook of Metrology and Testing written by Horst Czichos and published by Springer Science & Business Media. This book was released on 2011-07-22 with total page 1244 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
Download or read book Fundamentals of Nanoscale Film Analysis written by Terry L. Alford and published by Springer Science & Business Media. This book was released on 2007-02-16 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.
Download or read book Principles of Materials Characterization and Metrology written by Kannan M. Krishnan and published by Oxford University Press. This book was released on 2021 with total page 869 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Download or read book Auger Electron Spectroscopy written by C. L. Briant and published by . This book was released on 1988 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:
