Download or read book Electron Probe Microanalysis written by A. J. Tousimis and published by . This book was released on 1969 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metallurgical Microscopy written by Helfrid Modin and published by Elsevier. This book was released on 2016-01-22 with total page 485 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metallurgical Microscopy provides the general principles, methods, and techniques in metallurgical microscopy. The book initially provides the techniques for specimen preparation for macroscopic and microscopic examination. Subsequent chapters are devoted to the discussion of light-optical microscopy and photography, interferometry and contrast-raising methods, and microhardness measurement. Topics on high-temperature microscopy, a brief review of the electron microprobe and its applications, and the construction, properties and applications of the electron microscope are presented as well. Metallurgists and materials scientists will find the book very informative and useful.

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Download or read book Fifty Years of Progress in Metallographic Techniques written by American Society for Testing and Materials Annual Meeting and published by ASTM International. This book was released on 1968 with total page 414 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 760 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1970 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Vth International Congress on X Ray Optics and Microanalysis V Internationaler Kongre f r R ntgenoptik und Mikroanalyse Ve Congr s International sur l Optique des Rayons X et la Microanalyse written by Gottfried Möllenstedt and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.

Download or read book NIST Special Publication written by and published by . This book was released on 2000 with total page 1044 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed and published by Cambridge University Press. This book was released on 2005-08-25 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1971 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Industrial Applications Of Electron Microscopy written by Zhigang Li and published by CRC Press. This book was released on 2002-12-04 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.

Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1968 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metallurgical Applications of Shock Wave and High Strain Rate Phenomena written by Lawrence E. Murr and published by CRC Press. This book was released on 2024-11-01 with total page 1137 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book examines the explosive and related technologies in the context of metallurgical and materials processing and fabrication. It is a record of the international exchange of information on the metallurgical and other material effects of shock-wave and high-strain-rate phenomena.

Download or read book ASTM Special Technical Publication written by and published by . This book was released on 1968 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Catalog of National Bureau of Standards Publications 1966 1976 written by United States. National Bureau of Standards. Technical Information and Publications Division and published by . This book was released on 1978 with total page 844 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Journal of Research written by United States. National Bureau of Standards and published by . This book was released on 1968 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advances in Electronics and Electron Physics written by and published by Academic Press. This book was released on 1960 with total page 465 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Electronics and Electron Physics