Download or read book A Review Ultrahigh Vacuum Technology for Electron Microscopes written by Nagamitsu Yoshimura and published by Academic Press. This book was released on 2020-02-15 with total page 575 pages. Available in PDF, EPUB and Kindle. Book excerpt: A Review: Ultrahigh-Vacuum Technology for Electron Microscopes provides information on the fundamentals of ultra-high vacuum systems. It covers the very subtle process that can help increase pressure inside the microscope (or inside any other ultra-high vacuum system) and the different behavior of the molecules contributing to this kind of process. Prof Yoshimura’s book offers detailed information on electron microscope components, as well as UHV technology. This book is an ideal resource for industrial microscopists, engineers and scientists responsible for the design, operation and maintenance of electron microscopes. In addition, engineering students or engineers working with electron microscopes will find it useful. Teaches how to incorporate diffusion pumps for UHV electron microscopy Presents the work of an author who brings a lifetime of experience working on vacuum technology and electron microscopes

Download or read book Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes written by Nagamitsu Yoshimura and published by Springer Science & Business Media. This book was released on 2013-09-12 with total page 133 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today’s high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum. The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users’ reports of problems in the vacuum system of the JEM, such as the occurrence of a micro-discharge and the back-streaming of the diffusion pump (DP) oil vapor. This work is a valuable resource for researchers who use the transmission electron microscope and for engineers and scientists interested in its technology.

Download or read book An Ultrahigh Vacuum Scanning Electron Microscope written by Brian N. Halawith and published by . This book was released on 1986 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ultrahigh Vacuum Scanning Electron Microscopy and Special Effects in Secondary Emission Electron Spectroscopy written by Dale Everett Miller and published by . This book was released on 1981 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ultra High Vacuum scanning Electron Microscope Studies of Cs Si 100 2x1 written by Mohammad Azim and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ultra High Vacuum scanning Electron Microscope Studies of Cs written by Muḥammad ʻAẓīm and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ultrahigh Vacuum Transmission Electron Microscopy Studies of Semiconductor Surfaces written by Ganesh Jayaram and published by . This book was released on 1995 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Principles and Practice of Electron Microscopy written by Ian M. Watt and published by Cambridge University Press. This book was released on 1997-01-30 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

Download or read book Ultra High Vacuum Transmission Electron Microscopy of the Clean Surfaces of Au and Ir 001 written by Derren Neylon Dunn and published by . This book was released on 1992 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Vacuum Methods in Electron Microscopy written by Wilbur C. Bigelow and published by Ashgate Publishing. This book was released on 1994 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: This study provides full details and advice on the understanding and practical operation of the vacuum systems found in electron microscope laboratories. The importance of the correct functioning of these systems is too frequently underestimated, with the result that electron microscopes and other vacuum equipment, such as freeze-etching units and sputter coaters, give less than their optimum performance.

Download or read book Ultra High Vacuum in a Transmission Electron Microscope for Observing this Film Growth written by F. C. S. M. Tothill and published by . This book was released on 1969 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ultrahigh Vacuum High Resolution Transmission Electron Microscopy of Sputter Deposited MoSsub2 Thin Films written by and published by . This book was released on 1995 with total page 14 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution electron microscopy has been used to characterize the structure of sputter-deposited MoS2 coatings under both conventional and ultrahigh-vacuum (UHV) conditions. As deposited, the films have a mixture of short-range ordered basal-plane and edge-plane oriented grains near the film substrate interface; structural changes were characterized in a UHV transmission electron microscope as a function of two processing variables: temperature and Au deposition. Annealing in an oxygen environment was also carried out to assess chemical stability. During thermal annealing in UHV and in oxygen, substantial long-range ordering of the basal islands followed by grain growth was observed. Inhomogeneous oxidation resulting in the formation of MoO3 in the initial stages followed by grain growth, yielding the final morphology of a mixture of MoO3 crystallites of 5-50 nm size was seen on annealing in an oxidizing atmosphere. Au nucleation and growth on both thermally annealed and as-deposited films were seen to follow the Volmer-Weber mode. i.e., three-dimensional islands; these islands were also seen to be highly textured. Also, in comparison with carbon and SiO substrates, Au demonstrated higher stability to electron beam fluxes on MoS2, suggesting higher bonding strengths to the substrate. These experiments demonstrated the paramount need for UHv conditions during both deposition and characterization to avoid uncertain contamination artifacts.

Download or read book Scanning Electron Microscopy written by Oliver C. Wells and published by McGraw-Hill Companies. This book was released on 1974 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Use of the Scanning Electron Microscope written by J. W. S. Hearle and published by Pergamon. This book was released on 1972 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ultrahigh vacuum High resolution Transmission Electron Microscopy of Sputter deposited MoS2 Thin Films written by G. Jayaram and published by . This book was released on 1995 with total page 7 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Working with a Scanning Electron Microscope written by Steve K. Chapman and published by . This book was released on 1986 with total page 124 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book In Situ Scanning Electron Microscopy in Materials Research written by Klaus Wetzig and published by Wiley-VCH. This book was released on 1995-05-09 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.