Download or read book The Computer Engineering Handbook written by Vojin G. Oklobdzija and published by CRC Press. This book was released on 2001-12-26 with total page 1422 pages. Available in PDF, EPUB and Kindle. Book excerpt: There is arguably no field in greater need of a comprehensive handbook than computer engineering. The unparalleled rate of technological advancement, the explosion of computer applications, and the now-in-progress migration to a wireless world have made it difficult for engineers to keep up with all the developments in specialties outside their own. References published only a few years ago are now sorely out of date. The Computer Engineering Handbook changes all of that. Under the leadership of Vojin Oklobdzija and a stellar editorial board, some of the industry's foremost experts have joined forces to create what promises to be the definitive resource for computer design and engineering. Instead of focusing on basic, introductory material, it forms a comprehensive, state-of-the-art review of the field's most recent achievements, outstanding issues, and future directions. The world of computer engineering is vast and evolving so rapidly that what is cutting-edge today may be obsolete in a few months. While exploring the new developments, trends, and future directions of the field, The Computer Engineering Handbook captures what is fundamental and of lasting value.

Download or read book Proceedings written by and published by . This book was released on 1997 with total page 680 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Parallel Computing Fundamentals Applications and New Directions written by E.H. D'Hollander and published by Elsevier. This book was released on 1998-07-22 with total page 765 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume gives an overview of the state-of-the-art with respect to the development of all types of parallel computers and their application to a wide range of problem areas. The international conference on parallel computing ParCo97 (Parallel Computing 97) was held in Bonn, Germany from 19 to 22 September 1997. The first conference in this biannual series was held in 1983 in Berlin. Further conferences were held in Leiden (The Netherlands), London (UK), Grenoble (France) and Gent (Belgium). From the outset the aim with the ParCo (Parallel Computing) conferences was to promote the application of parallel computers to solve real life problems. In the case of ParCo97 a new milestone was reached in that more than half of the papers and posters presented were concerned with application aspects. This fact reflects the coming of age of parallel computing. Some 200 papers were submitted to the Program Committee by authors from all over the world. The final programme consisted of four invited papers, 71 contributed scientific/industrial papers and 45 posters. In addition a panel discussion on Parallel Computing and the Evolution of Cyberspace was held. During and after the conference all final contributions were refereed. Only those papers and posters accepted during this final screening process are included in this volume. The practical emphasis of the conference was accentuated by an industrial exhibition where companies demonstrated the newest developments in parallel processing equipment and software. Speakers from participating companies presented papers in industrial sessions in which new developments in parallel computing were reported.

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Download or read book Sequential Circuit Test Pattern Generation Using Empirical Partial Scan and Distributed Computation written by Kee Sup Kim and published by . This book was released on 1992 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Synthesis Approach to Digital System Design written by Petra Michel and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over the past decade there has been a dramatic change in the role played by design automation for electronic systems. Ten years ago, integrated circuit (IC) designers were content to use the computer for circuit, logic, and limited amounts of high-level simulation, as well as for capturing the digitized mask layouts used for IC manufacture. The tools were only aids to design-the designer could always find a way to implement the chip or board manually if the tools failed or if they did not give acceptable results. Today, however, design technology plays an indispensable role in the design ofelectronic systems and is critical to achieving time-to-market, cost, and performance targets. In less than ten years, designers have come to rely on automatic or semi automatic CAD systems for the physical design ofcomplex ICs containing over a million transistors. In the past three years, practical logic synthesis systems that take into account both cost and performance have become a commercial reality and many designers have already relinquished control ofthe logic netlist level of design to automatic computer aids. To date, only in certain well-defined areas, especially digital signal process ing and telecommunications. have higher-level design methods and tools found significant success. However, the forces of time-to-market and growing system complexity will demand the broad-based adoption of high-level, automated methods and tools over the next few years.

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Download or read book Proceedings of the IEEE International Conference on Electronics Circuits and Systems written by and published by . This book was released on 1996 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Evolution of Engineering and Information Systems and Their Applications written by Lakhmi C. Jain and published by CRC Press. This book was released on 1999-09-24 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: Worldwide interest in the applications of evolutionary computing techniques to the design of engineering and information systems grows each day. Pattern recognition, control systems, factory scheduling, automation, generation of computer programs, and the design of intelligent paradigms all benefit from evolutionary techniques-their potential applications indeed seem limited only by the imaginations of scientists and engineers. This is an area of intensive research and development, and evolutionary computing techniques are themselves constantly evolving. It becomes important, then, that computer scientists and applications engineers have a working knowledge of the techniques, stay abreast of recent advances, and have the opportunity to incorporate them into their own systems and designs. Evolution of Engineering and Information Systems and Their Applications fills this need by providing an overview of the field and offering state-of-the-art reviews of the most important techniques and applications of evolutionary computing. The top experts from around the world discuss developments in genetic algorithms, genetic programming, and evolutionary strategies and applications including VLSI CAD, robot sensors, neural networks, and fuzzy classification systems. This is a new and very hot field, yet there are few-if any-resources that document and disseminate its advances. With Evolution of Engineering and Information Systems and Their Applications, you have the opportunity to learn from the leading authorities, use these powerful techniques to improve your own systems, and help evolutionary computing reach its nearly boundless potential.

Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Download or read book Test Generation of Crosstalk Delay Faults in VLSI Circuits written by S. Jayanthy and published by Springer. This book was released on 2018-09-20 with total page 161 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Download or read book Computer Aided Verification written by Edmund M. Clarke and published by Springer Science & Business Media. This book was released on 1991-10-02 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the proceedings of the second workshop on Computer Aided Verification, held at DIMACS, Rutgers University, June 18-21, 1990. Itfeatures theoretical results that lead to new or more powerful verification methods. Among these are advances in the use of binary decision diagrams, dense time, reductions based upon partial order representations and proof-checking in controller verification. The motivation for holding a workshop on computer aided verification was to bring together work on effective algorithms or methodologies for formal verification - as distinguished, say,from attributes of logics or formal languages. The considerable interest generated by the first workshop, held in Grenoble, June 1989 (see LNCS 407), prompted this second meeting. The general focus of this volume is on the problem of making formal verification feasible for various models of computation. Specific emphasis is on models associated with distributed programs, protocols, and digital circuits. The general test of algorithm feasibility is to embed it into a verification tool, and exercise that tool on realistic examples: the workshop included sessionsfor the demonstration of new verification tools.

Download or read book Digest of Technical Papers written by and published by . This book was released on 1999 with total page 652 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Download or read book Proceedings Sixth International Conference on Tools with Artificial Intelligence written by and published by . This book was released on 1994 with total page 876 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings of the 35th Midwest Symposium on Circuits and Systems written by George Washington University. Department of Electrical Engineering and Computer Science and published by Piscataway, NJ : Institute of Electrical and Electronics Engineers. This book was released on 1992 with total page 858 pages. Available in PDF, EPUB and Kindle. Book excerpt: