Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Digest of Technical Papers written by and published by . This book was released on 1988 with total page 590 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Digital Timing Macromodeling for VLSI Design Verification written by Jeong-Taek Kong and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.

Download or read book Switch Level Timing Simulation of MOS VLSI Circuits written by Vasant B. Rao and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 218 pages. Available in PDF, EPUB and Kindle. Book excerpt: Only two decades ago most electronic circuits were designed with a slide-rule, and the designs were verified using breadboard techniques. Simulation tools were a research curiosity and in general were mistrusted by most designers and test engineers. In those days the programs were not user friendly, models were inadequate, and the algorithms were not very robust. The demand for simulation tools has been driven by the increasing complexity of integrated circuits and systems, and it has been aided by the rapid decrease in the cost of com puting that has occurred over the past several decades. Today a wide range of tools exist for analYSiS, deSign, and verification, and expert systems and synthesis tools are rapidly emerging. In this book only one aspect of the analysis and design process is examined. but it is a very important aspect that has received much attention over the years. It is the problem of accurate circuit and timing simulation.

Download or read book Switch level Fault Simulation of MOS VLSI Circuits written by Evstratios Vandris and published by . This book was released on 1991 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Energy Research Abstracts written by and published by . This book was released on 1990 with total page 608 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Recent Topics on Modeling of Semiconductor Processes Devices and Circuits written by Rasit Onur Topaloglu and published by Bentham Science Publishers. This book was released on 2011-09-09 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt: "The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transisto"

Download or read book Technical Reports Awareness Circular TRAC written by and published by . This book was released on 1989-11 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 1991 IEEE International Symposium on Circuits and Systems written by and published by . This book was released on 1991 with total page 570 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits written by Sandeep K. Goel and published by CRC Press. This book was released on 2017-12-19 with total page 259 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.

Download or read book Engineering Documents Center Index written by University of Illinois at Urbana-Champaign. Engineering Documents Center and published by . This book was released on 1989 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Computer Simulation of Electronic Circuits written by R. Raghuram and published by New Age International. This book was released on 1989 with total page 268 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Book On A Very Topical Subject Is Aimed At Engineers Who Either Use Or Develop Cad Tools For Circuit Design, Be It At The Discrete Device Level Or At The Lsi/Vlsi Level. The Book Is Unique In The Sense That It Covers Analog Circuit Simulation, Device Models, Logic Simulation And Fault Simulation. These Topics Traditionally Belong To Different Areas Of Electrical Engineering And Are Therefore Not Covered In One Book. However, A Person Doing Circuit Design On A Computer Today Needs To Know All Aspects Of The Simulation. This Book Attempts To Satisfy This Need. Many Examples Of Programs As Well As Applications Are Given. Every Chapter Contains Solved As Well As Unsolved Problems. In Addition, Programming Assignments Are Included. Mathematics Has Been Kept To A Minimum And An Intuitive Approach Has Been Taken.The Background Required Is That Of Final Year Undergraduate In Electrical Engineering. It Is Expected That Much Of This Material Would Percolate Down To More Basic Courses In Future Years.

Download or read book A Unified Approach for Timing Verification and Delay Fault Testing written by Mukund Sivaraman and published by Springer Science & Business Media. This book was released on 2012-09-17 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.

Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Download or read book LSI VLSI Testability Design written by Frank F. Tsui and published by McGraw-Hill Companies. This book was released on 1987 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Modeling and Simulation written by and published by . This book was released on 1990 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IEEE Proceedings of the Southeastcon written by and published by . This book was released on 1989 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: