Download or read book Ageing of Integrated Circuits written by Basel Halak and published by Springer Nature. This book was released on 2019-09-30 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Download or read book Lifetime Reliability aware Design of Integrated Circuits written by Mohsen Raji and published by Springer Nature. This book was released on 2022-11-16 with total page 113 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Download or read book Aging Analysis of Digital Integrated Circuits written by Dominik Lorenz and published by . This book was released on 2012 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Aging Aware Design Methods for Reliable Analog Integrated Circuits Using Operating Point Dependent Degradation written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Aging Aware Design Methods for Reliable Analog Integrated Circuits Using Operating Point Dependent Degradation written by Nico Hellwege and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Variation aware and Aging aware Design Tools and Techniques for Nanometer scale Integrated Circuits written by Saket Gupta and published by . This book was released on 2012 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design for reliability Methodologies to Address BTI induced Aging in Digital Integrated Circuits written by Senthil Arasu Thirunavukarasu and published by . This book was released on 2013 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: This dissertation contributes to the research in advancing the state-of-art in design-for-reliability methodologies for digital integrated circuits. In particular, we present three different methodologies to combat performance degradation due to Bias Temperature Instability (BTI) in logic paths and clock paths.
Download or read book Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications written by Automotive Electronic Systems Reliability Standards and published by . This book was released on 2007 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. This document primarily deals with integrated circuit issues, but can easily be adapted for use in discrete or passive component qualification with the generation of a list of failure mechanisms relevant to those devices. Component qualification is the main scope of this document. Other procedures addressing extrinsic defects are specifically addressed in the monitoring chapter. This document is to be used within the context of achieving Zero Defect in component manufacturing and product use. NOTE: The term "shall" indicates a binding requirement.Members of SAE International Automotive Electronic Systems Reliability Standards Committee, ZVEI (German Electrical and Electronic Manufacturers` Association), AEC (Automotive Electronics Council) and JSAE (Japanese Society of Automotive Engineers) formed a joint task force and met to update SAE Recommended Practice J1879-October-1988 (General Qualification and Production Acceptance Criteria for Integrated Circuits in Automotive Applications). This version did not describe methods to demonstrate that a device under test would meet the customer demand for failure levels in the single-digit parts per million (ppm) range. Additionally, with the old qualification "test-to-pass" approach, there is very little knowledge generated about the relevant component failure mechanisms that may occur at the boundaries of the specification limits. Extending the old approach to single-digit ppm levels is unfeasible with respect to both economics and time. A new knowledge-based approach to understanding and preventing the occurrence of the relevant component failure mechanisms was required.The joint task force concluded that the J1879 Recommended Practice should be revised to encompass a Robustness Validation approach and that an Automotive Electronics Robustness Validation Handbook should be published. This handbook is based on information from a wide number of sources including international Automotive OEMs and their full supply chain, engineering societies, and other related organizations.
Download or read book Fundamentals of Electromigration Aware Integrated Circuit Design written by Jens Lienig and published by Springer. This book was released on 2018-02-23 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Download or read book CMOS Digital Integrated Circuits written by Sung-Mo Kang and published by . This book was released on 2002 with total page 655 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fourth edition of CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehensive coverage of digital CMOS circuit design, as well as addressing state-of-the-art technology issues highlighted by the widespread use of nanometer-scale CMOS technologies. In this latest edition, virtually all chapters have been re-written, the transistor model equations and device parameters have been revised to reflect the sigificant changes that must be taken into account for new technology generations, and the material has been reinforced with up-to-date examples. The broad-ranging coverage of this textbook starts with the fundamentals of CMOS process technology, and continues with MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, arithmetic building blocks, clock and I/O circuits, low power design techniques, design for manufacturability and design for testability.
Download or read book Digital Integrated Circuits written by Jan M. Rabaey and published by . This book was released on 1996 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt: Beginning with discussions on the operation of electronic devices and analysis of the nucleus of digital design, the text addresses: the impact of interconnect, design for low power, issues in timing and clocking, design methodologies, and the effect of design automation on the digital design perspective.
Download or read book Foundations of Analog and Digital Electronic Circuits written by Anant Agarwal and published by Elsevier. This book was released on 2005-07-01 with total page 1009 pages. Available in PDF, EPUB and Kindle. Book excerpt: Unlike books currently on the market, this book attempts to satisfy two goals: combine circuits and electronics into a single, unified treatment, and establish a strong connection with the contemporary world of digital systems. It will introduce a new way of looking not only at the treatment of circuits, but also at the treatment of introductory coursework in engineering in general. Using the concept of ''abstraction,'' the book attempts to form a bridge between the world of physics and the world of large computer systems. In particular, it attempts to unify electrical engineering and computer science as the art of creating and exploiting successive abstractions to manage the complexity of building useful electrical systems. Computer systems are simply one type of electrical systems.+Balances circuits theory with practical digital electronics applications.+Illustrates concepts with real devices.+Supports the popular circuits and electronics course on the MIT OpenCourse Ware from which professionals worldwide study this new approach.+Written by two educators well known for their innovative teaching and research and their collaboration with industry.+Focuses on contemporary MOS technology.
Download or read book Microelectronic Systems written by Albert Heuberger and published by Springer Science & Business Media. This book was released on 2011-12-26 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is dedicated to Prof. Dr. Heinz Gerhäuser on the occasion of his retirement both from the position of Executive Director of the Fraunhofer Institute for Integrated Circuits IIS and from the Endowed Chair of Information Technologies with a Focus on Communication Electronics (LIKE) at the Friedrich-Alexander-Universität Erlangen-Nürnberg. Heinz Gerhäuser's vision and entrepreneurial spirit have made the Fraunhofer IIS one of the most successful and renowned German research institutions. He has been Director of the Fraunhofer IIS since 1993, and under his leadership it has grown to become the largest of Germany's 60 Fraunhofer Institutes, a position it retains to this day, currently employing over 730 staff. Likely his most important scientific as well as application-related contribution was his pivotal role in the development of the mp3 format, which would later become a worldwide success. The contributions to this Festschrift were written by both Fraunhofer IIS staff and external project team members in appreciation of Prof. Dr. Gerhäuser's lifetime academic achievements and his inspiring leadership at the Fraunhofer IIS. The papers reflect the broad spectrum of the institute's research activities and are grouped into sections on circuits, information systems, visual computing, and audio and multimedia. They provide academic and industrial researchers in fields like signal processing, sensor networks, microelectronics, and integrated circuits with an up-to-date overview of research results that have a huge potential for cutting-edge industrial applications.
Download or read book Paper written by and published by . This book was released on 1987 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book ESD in Silicon Integrated Circuits written by E. Ajith Amerasekera and published by John Wiley & Sons. This book was released on 2002-05-22 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: * Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits. * Provides guidance on the implementation of circuit protection measures. * Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts. * Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.
Download or read book Electronic Components and Systems written by W. H. Dennis and published by Elsevier. This book was released on 2013-10-22 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electronic Components and Systems focuses on the principles and processes in the field of electronics and the integrated circuit. Covered in the book are basic aspects and physical fundamentals; different types of materials involved in the field; and passive and active electronic components such as capacitors, inductors, diodes, and transistors. Also covered in the book are topics such as the fabrication of semiconductors and integrated circuits; analog circuitry; digital logic technology; and microprocessors. The monograph is recommended for beginning electrical engineers who would like to know the fundamental concepts, theories, and processes in the related fields.
Download or read book High Temperature Electronics written by F. Patrick McCluskey and published by CRC Press. This book was released on 1996-12-13 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: The development of electronics that can operate at high temperatures has been identified as a critical technology for the next century. Increasingly, engineers will be called upon to design avionics, automotive, and geophysical electronic systems requiring components and packaging reliable to 200 °C and beyond. Until now, however, they have had no single resource on high temperature electronics to assist them. Such a resource is critically needed, since the design and manufacture of electronic components have now made it possible to design electronic systems that will operate reliably above the traditional temperature limit of 125 °C. However, successful system development efforts hinge on a firm understanding of the fundamentals of semiconductor physics and device processing, materials selection, package design, and thermal management, together with a knowledge of the intended application environments. High Temperature Electronics brings together this essential information and presents it for the first time in a unified way. Packaging and device engineers and technologists will find this book required reading for its coverage of the techniques and tradeoffs involved in materials selection, design, and thermal management and for its presentation of best design practices using actual fielded systems as examples. In addition, professors and students will find this book suitable for graduate-level courses because of its detailed level of explanation and its coverage of fundamental scientific concepts. Experts from the field of high temperature electronics have contributed to nine chapters covering topics ranging from semiconductor device selection to testing and final assembly.
