Download or read book Advances in Optical Surface Metrology by Phase and Prescription Retrieval written by Aaron M. Michalko and published by . This book was released on 2020 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This thesis presents advances in the application of phase retrieval techniques to optical metrology of spherical and freeform surfaces. We explore metrology configurations using transverse translation-diverse phase retrieval (TTDPR), in which translating subaperture illumination is projected on the test surface. The wavefront aberration, and from it surface error, can be reconstructed from measured reflected intensities. TTDPR is advantageous for freeform surface metrology due to its relatively simple hardware requirements and demonstrated accuracy in other fields. Through simulations we probe TTDPR performance as a function of various parameters including illumination beam softness, detector signal-to-noise ratio and position uncertainty of the illumination. We report on the laboratory measurement of a concave spherical test surface using TTDPR, which agrees with an interferometric measurement to 0:006[lambda] root-mean-square (RMS) with certain terms removed. We report on measurements of a concave freeform using TTDPR. Freeform surface reconstructions from two disjoint datasets agree to 13 nm RMS, or 0:02[lambda] RMS at [lambda] = 632:8nm. Next we explore configurations suitable for metrology of convex surfaces. We explore a configuration using converging source illumination and a moving test surface. We discuss a suitable algorithm, prescription retrieval, with which we directly reconstruct surface prescription terms from measured intensities using combined ray-tracing and diffraction modeling. A prescription retrieval algorithm is demonstrated through simulation and ultimately a convex surface measurement using the technique is demonstrated"--Pages xi-xii.
Download or read book Optical Metrology by Prescription Retrieval and Transverse translation Diversity Phase Retrieval written by Dustin B. Moore and published by . This book was released on 2016 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Phase retrieval (PR) has been integral to the success of wavefront sensing for alignment of space telescope systems, like NASA's Hubble Space Telescope and the James Webb Space Telescope, and it has shown promise for optical shop testing. It requires that an optical system image a target such as a star or an illuminated pinhole onto a detector array. The measured intensity, the point spread function (PSF), becomes input to a nonlinear optimization process which finds wavefront aberrations that predict PSFs consistent with the measured PSFs. Transverse-translation-diversity phase retrieval (TTDPR) is a ptychographic algorithm in which multiple PSFs are acquired for various translations of a subaperture. The subaperture translates in a plane conjugate to the exit pupil. We assess informationtheoretic limits on the ability to estimate subaperture translation, essential for accurate metrology, as a function of the aberrations of the system. Attention is given to the case that an unknown linear phase aberration, or equivalent detector or target motion, is present that varies with each PSF. We then introduce unknown-transverse translation diversity phase retrieval: an algorithm that estimates the direction of translation and the distance traveled by the subaperture from one PSF to the next. Uniquely, it estimates translations without prior information about the approximate direction of translation. It also estimates unknown point target motion and rotations of the subaperture between PSF acquisitions from the PSF data. In prescription retrieval, the unknowns being searched for are the prescription parameters of a sequential raytrace of the optical system. This search was previously hampered by the use of gradients calculated by the method of finite-differences (FD). Gradients calculated using FD become slow for problems involving many unknowns, and/or a large amount of PSF data to be fit. We use the reverse mode of algorithmic differentiation (RMAD) to find fast analytic gradient computations for metrics depending on raytraces of systems including freeform surfaces. This is combined with a customized diffraction integral model to perform prescription retrieval using computationally-efficient gradient functions. Finally, we show a simulated example where the use of RMAD gradients speeds computation by a projected 10, 000 times"--Pages ix-x.
Download or read book Advances in Optical Surface Texture Metrology written by Richard Leach and published by . This book was released on 2020 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Download or read book Advances in Optical Surface Texture Metrology written by Richard Leach and published by Myprint. This book was released on 2020-12-21 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Optical Surface Texture Metrology written by R. K. Leach and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Download or read book Optical Metrology written by Kjell J. Gåsvik and published by John Wiley & Sons. This book was released on 2003-04-11 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.
Download or read book Application of Phase Retrieval to the Measurement of Optical Surfaces and Wavefronts written by Gregory R. Brady and published by . This book was released on 2008 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Advances in Optical Metrology written by N. Balasubramanian and published by . This book was released on 1978 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fringe 2009 written by Wolfgang Osten and published by Springer Science & Business Media. This book was released on 2010-04-28 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: 21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.
Download or read book Advances in Optical Form and Coordinate Metrology written by Richard Leach and published by Myprint. This book was released on 2020-12-13 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (e.g. in additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Key Features Provides cutting-edge advances in the field Includes new ISO framework for performance verification Presents advances in artificial intelligence Includes advances in in-process measurement Discusses a forward look at calibration
Download or read book Advances in Speckle Metrology and Related Techniques written by Guillermo H. Kaufmann and published by John Wiley & Sons. This book was released on 2011-01-25 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.
Download or read book Recent Advances in Optical Metrology 2007 written by J. Apolinar Muñoz Rodriguez and published by . This book was released on 2007-01-01 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last years, optical metrology has emerged as a discipline in the optical science and engineering. This occurred with the results achieved in engineering and technology, which can be applied in a variety of the industrial process. Optical testing supports that optical metrology becomes essential tools in modern industry and laboratory process. Optical methods of measurement have provided many of the essential techniques in quality control and industrial inspection. This current volume is a report of the recent contributions of a group of us who have been working together in the metrology department of the Centro de Investigaciones en Optica in Mexico. The main topics of metrology described in this volume includes, fringe pattern processing, speckle pattern interferometry, computer vision, velocimetry of paticles, vibrations measurement and pattern classification. In this chapter it describes a measurement technique based on the phenomenon known as coherent light speckle. The major feature of electronic speckle techniques is that they enable real-time correlation fringes to be displayed directly on a monitor without recourse to any form of photographic processing, optical spatial filtering, or plate relocation. No dark room is required for processing photo materials. A computer is used to control the entire process, to calculate the displacement, and to present results in graphical form. It is well known that when an optically rough surface is illuminated by coherent light speckles can be observed and imaged on a detector. Changes in the speckle pattern due to displacement and deformation of the diffusing surface can be used within a double-exposure metrology approach [6]. Indeed, for objects with optically rough surfaces, Electronic Speckle Pattern Interferometry (ESPI) [7] is one of the most suitable method for high sensitivity measurements of out-of-plane and in-plane displacement components [8,1], strain [9,10], and vibration [11,12]. Moreover, since nowadays the signal can be easily acquired in a digital form, various image-processing techniques could be applied to automatically process ESPI interferograms. The deformation field in the form of correlation fringes is obtained by subtracting or adding two images of the object in the reference and in the deformed configuration, respectively. Among the variety of techniques developed for phase retrieval, the Fast Fourier Transform Method proposed by Takeda [13], the Phase-Shifting [7] and Spatial Synchronous Detection [7] methods are the most widely accepted. It will be present an optical setup that can be switched to produce in-plane and out-of-plane sensitivity interferometers (we call it in the rest of the presentation System A, for brevity). It is depicted an ESPI arrangement with three illumination beams and one reference beam too (this it will named System B). The phase step algorithm was used to calculate a phase value at each pixel from the intensities. Both optical systems are limited for stationary and repeatable displacements fields. A method for simultaneously measuring whole field in-plane displacements by using optical fiber and Fast Fourier Transform Method is presented to transient or non-repeatable events. Examples of applications are presented such as fatigue detection and visualization of vibration modes.
Download or read book Optical Metrology written by Olivério D.D. Soares and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 794 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.
Download or read book Optical Metrology and Optoacoustics in Nondestructive Evaluation of Materials written by Zinoviy Nazarchuk and published by Springer Nature. This book was released on 2023-05-23 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book includes the description, modeling and realization of new optical metrology techniques for technical diagnostics of materials. Special attention is paid to multi-step phase shifting interferometry with arbitrary phase shifts between interferograms, phase shifting and correlation digital speckle pattern interferometry, optical-digital speckle correlation, and digital image correlation, as well as dynamic speckle patterns analysis. Optoacoustic techniques can be treated as a separate branch of optical metrology and can solve many problems of technical diagnostics, including detection and localization of subsurface defects in laminated composite materials. The utility of such techniques can be increased by illumination of the object via acoustic waves at certain frequencies. Hence, an effective theoretical approach to the modeling of an elastic wave field interaction with an interphase defect, and to defect visualization using dynamic speckle patterns, is also included in this book. The experimental proof of the proposed approaches was achieved using a specially created hybrid optical-digital system for detection of different subsurface defects. This book is intended for engineers, researchers and students engaged in the field of nondestructive evaluation of materials and technical diagnostics of structural elements, hybrid optical systems, speckle metrology and optoacoustic imaging techniques.
Download or read book Optical Metrology with Interferometry written by Dahi Ghareab Abdelsalam Ibrahim and published by Cambridge Scholars Publishing. This book was released on 2019-07-31 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high precision. Each method has both its strong points and its limitations. This book explains in detail the basics of optical interferometry, their common language, generic features and limitations, and their simulation and uncertainties. Moreover, it provides an introduction to new frontiers in optical interferometry, including terahertz technology and optical frequency combs.
Download or read book Handbook of Optical Metrology written by Toru Yoshizawa and published by CRC Press. This book was released on 2017-07-28 with total page 866 pages. Available in PDF, EPUB and Kindle. Book excerpt: Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Download or read book Advances in Optical Form and Coordinate Metrology written by LEACH and published by Emerging Technologies in Optic. This book was released on 2020-12-10 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (e.g. in additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Key Features Provides cutting-edge advances in the field Includes new ISO framework for performance verification Presents advances in artificial intelligence Includes advances in in-process measurement Discusses a forward look at calibration
