Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Download or read book Defect Oriented Testing for Nano Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Download or read book Testing Static Random Access Memories written by Said Hamdioui and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

Download or read book Advances in Food Authenticity Testing written by Gerard Downey and published by Woodhead Publishing. This book was released on 2016-08-22 with total page 798 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Advances in Food Authenticity Testing" covers a topic that is of great importance to both the food industry whose responsibility it is to provide clear and accurate labeling of their products and maintain food safety and the government agencies and organizations that are tasked with the verification of claims of food authenticity. The adulteration of foods with cheaper alternatives has a long history, but the analytical techniques which can be implemented to test for these are ever advancing. The book covers the wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processes. The first part of the book examines, in detail, the scientific basis and the process of how these techniques are used, while other sections highlight specific examples of the use of these techniques in the testing of various foods. Written by experts in both academia and industry, the book provides the most up-to-date and comprehensive coverage of this important and rapidly progressing field. Covers a topic that is of great importance to both the food industry and the governmental agencies tasked with verifying the safety and authenticity of food productsPresents a wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processesHighlights specific examples of the use of the emerging techniques and testing strategies for various foods

Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Download or read book Electronic Testing and Fault Diagnosis written by George Loveday and published by . This book was released on 1989 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Download or read book Simply Explained 366 Businesses for Industrial Supplies written by Mansoor Muallim and published by M M Infocare. This book was released on with total page 1084 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fasteners Manufacturing 1. Market Overview: The fasteners manufacturing industry is a crucial component of the global manufacturing and construction sectors. Fasteners are essential in joining and securing various components in machinery, automotive, construction, aerospace, and other industries. The global fasteners market has witnessed steady growth due to the increasing demand for durable and reliable fastening solutions across industries. 2. Market Segmentation: The fasteners manufacturing market can be segmented as follows: a. Product Type: • Bolts • Screws • Nuts • Rivets • Washers • Others b. Material: • Steel • Aluminum • Brass • Plastic • Others c. End-Use Industry: • Automotive • Construction • Aerospace • Electronics • Energy • Industrial Machinery • Others 3. Regional Analysis: The global fasteners market is distributed across several regions: • North America: High demand due to the automotive and construction industries. • Europe: Strong market presence, especially in automotive manufacturing. • Asia-Pacific: Dominant due to rapid industrialization and construction activities. • Middle East and Africa: Steady growth driven by infrastructure development. • Latin America: Increasing demand in the construction and aerospace sectors. 4. Market Drivers: • Global Infrastructure Development: Increasing construction activities worldwide drive demand for fasteners. • Automotive Industry Growth: The automotive industry's expansion fuels demand for high-quality fasteners. • Industrialization: Ongoing industrialization in emerging markets boosts the manufacturing sector. • Aerospace Advancements: Advancements in aerospace technologies require specialized fasteners. 5. Market Challenges: • Fluctuating Raw Material Prices: The fasteners industry is sensitive to fluctuations in metal and alloy prices. • Environmental Regulations: Compliance with environmental regulations poses challenges in material usage and disposal. • Intense Competition: The market is highly competitive, leading to price wars. 6. Opportunities: • Customization: Meeting specific industry needs with tailor-made fasteners. • Eco-friendly Solutions: Developing sustainable and recyclable fasteners. • Digitalization: Embracing Industry 4.0 for improved production processes. 7. Future Outlook: The fasteners manufacturing industry is expected to continue its growth trajectory, driven by global economic recovery, infrastructure investments, and technological advancements. The market is likely to witness an increasing shift toward lightweight materials and sustainable fastening solutions. Conclusion: The global fasteners manufacturing industry is a vital part of various sectors, ensuring the safety and reliability of products worldwide. With a diverse range of products, materials, and end-use industries, the market offers opportunities for innovation and growth. However, it also faces challenges related to raw material prices and environmental regulations. To stay competitive, companies should focus on customization, sustainability, and digitalization to meet the evolving demands of industries worldwide. The future of fasteners manufacturing looks promising as it continues to adapt to the changing global landscape.

Download or read book Introduction to Advanced System on Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Download or read book Digital Timing Measurements written by Wolfgang Maichen and published by Springer Science & Business Media. This book was released on 2006-10-03 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this field an engineer needs to understand instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. This book gives a compact, practice-oriented overview on all these subjects with emphasis on useable concepts and real-life guidelines.

Download or read book Testing Active and Passive Electronic Components written by Richard Powell and published by CRC Press. This book was released on 1987-03-12 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book meets the vital need of providing one place where a comprehensive information on how to test more than one type of electronic component. It provides a key information necessary to allow users to get started immediately on component testing and presents effective options for handling high-, low- and medium-volume testing.

Download or read book High Voltage Engineering and Testing written by Hugh McLaren Ryan and published by IET. This book was released on 2001 with total page 748 pages. Available in PDF, EPUB and Kindle. Book excerpt: High voltage, Electrical engineering, Electronic engineering, Electrical testing, Building and Construction

Download or read book Next Generation Java Testing written by Cédric Beust and published by Pearson Education. This book was released on 2007-10-15 with total page 523 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enterprise Java developers must achieve broader, deeper test coverage, going beyond unit testing to implement functional and integration testing with systematic acceptance. Next Generation JavaTM Testing introduces breakthrough Java testing techniques and TestNG, a powerful open source Java testing platform. Cédric Beust, TestNG's creator, and leading Java developer Hani Suleiman, present powerful, flexible testing patterns that will work with virtually any testing tool, framework, or language. They show how to leverage key Java platform improvements designed to facilitate effective testing, such as dependency injection and mock objects. They also thoroughly introduce TestNG, demonstrating how it overcomes the limitations of older frameworks and enables new techniques, making it far easier to test today's complex software systems. Pragmatic and results-focused, Next Generation JavaTM Testing will help Java developers build more robust code for today's mission-critical environments. This book Illuminates the tradeoffs associated with testing, so you can make better decisions about what and how to test Introduces TestNG, explains its goals and features, and shows how to apply them in real-world environments Shows how to integrate TestNG with your existing code, development frameworks, and software libraries Demonstrates how to test crucial code features, such as encapsulation, state sharing, scopes, and thread safety Shows how to test application elements, including JavaEE APIs, databases, Web pages, and XML files Presents advanced techniques: testing partial failures, factories, dependent testing, remote invocation, cluster-based test farms, and more Walks through installing and using TestNG plug-ins for Eclipse, and IDEA Contains extensive code examples Whether you use TestNG, JUnit, or another testing framework, the testing design patterns presented in this book will show you how to improve your tests by giving you concrete advice on how to make your code and your design more testable.

Download or read book Advanced Materials for Thermal Management of Electronic Packaging written by Xingcun Colin Tong and published by Springer Science & Business Media. This book was released on 2011-01-05 with total page 633 pages. Available in PDF, EPUB and Kindle. Book excerpt: The need for advanced thermal management materials in electronic packaging has been widely recognized as thermal challenges become barriers to the electronic industry’s ability to provide continued improvements in device and system performance. With increased performance requirements for smaller, more capable, and more efficient electronic power devices, systems ranging from active electronically scanned radar arrays to web servers all require components that can dissipate heat efficiently. This requires that the materials have high capability of dissipating heat and maintaining compatibility with the die and electronic packaging. In response to critical needs, there have been revolutionary advances in thermal management materials and technologies for active and passive cooling that promise integrable and cost-effective thermal management solutions. This book meets the need for a comprehensive approach to advanced thermal management in electronic packaging, with coverage of the fundamentals of heat transfer, component design guidelines, materials selection and assessment, air, liquid, and thermoelectric cooling, characterization techniques and methodology, processing and manufacturing technology, balance between cost and performance, and application niches. The final chapter presents a roadmap and future perspective on developments in advanced thermal management materials for electronic packaging.