Download or read book Accuracy of Nanoscale Pitch Standards written by and published by DIANE Publishing. This book was released on with total page 16 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Download or read book Nanoscale Standards by Metrological AFM and Other Instruments written by Ichiko Misumi and published by IOP Publishing Limited. This book was released on 2021-05-20 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications. Key features Practical guide for users and practitioners Puts nanoscale standards in a practical context. Covers a range of measurement modalities. 2D and 3D measurements.
Download or read book Quantum Materials Devices and Applications written by Mohamed Henini and published by Elsevier. This book was released on 2022-08-24 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantum Materials, Devices, and Applications covers the advances made in quantum technologies, both in research and mass production for applications in electronics, photonics, sensing, biomedical, environmental and agricultural applications. The book includes new materials, new device structures that are commercially available, and many more at the advanced research stage. It reviews the most relevant, current and emerging materials and device structures, organized by key applications and covers existing devices, technologies and future possibilities within a common framework of high-performance quantum devices. This book will be ideal for researchers and practitioners in academia, industry and those in materials science and engineering, electrical engineering and physics disciplines. - Comprehensively covers the important and rapidly growing area of quantum technologies by focusing on current and emerging materials, devices and applications - Takes an applied approach to the topic by addressing key applications in electronics, optoelectronics, photonics, sensing and the environment - Addresses ethical considerations, remaining challenges and future opportunities for quantum materials and devices
Download or read book Optical Imaging and Metrology written by Wolfgang Osten and published by John Wiley & Sons. This book was released on 2012-09-10 with total page 471 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Download or read book Guide to NIST National Institute of Standards and Technology written by DIANE Publishing Company and published by DIANE Publishing. This book was released on 1997-07 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gathers in one place descriptions of NIST's many programs, products, services, and research projects, along with contact names, phone numbers, and e-mail and World Wide Web addresses for further information. It is divided into chapters covering each of NIST's major operating units. In addition, each chapter on laboratory programs includes subheadings for NIST organizational division or subject areas. Covers: electronics and electrical engineering; manufacturing engineering; chemical science and technology; physics; materials science and engineering; building and fire research and information technology.
Download or read book Nanotechnology Standards written by Vladimir Murashov and published by Springer Science & Business Media. This book was released on 2011-02-01 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK
Download or read book Quantitative Data Processing in Scanning Probe Microscopy written by Petr Klapetek and published by William Andrew. This book was released on 2012-12-31 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. - Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings - Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable - Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available)
Download or read book Journal of Research of the National Institute of Standards and Technology written by and published by . This book was released on 1998 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Download or read book Precision Dimensional Measurements written by Kuang-Chao Fan and published by MDPI. This book was released on 2019-10-21 with total page 596 pages. Available in PDF, EPUB and Kindle. Book excerpt: This collection represents successful invited submissions from the papers presented at the 8th Annual Conference of Energy Economics and Management held in Beijing, China, 22–24 September 2017. With over 500 participants, the conference was co-hosted by the Management Science Department of National Natural Science Foundation of China, the Chinese Society of Energy Economics and Management, and Renmin University of China on the subject area of “Energy Transition of China: Opportunities and Challenges”. The major strategies to transform the energy system of China to a sustainable model include energy/economic structure adjustment, resource conservation, and technology innovation. Accordingly, the conference and its associated publications encourage research to address the major issues faced in supporting the energy transition of China. Papers published in this collection cover the broad spectrum of energy economics issues, including building energy efficiency, industrial energy demand, public policies to promote new energy technologies, power system control technology, emission reduction policies in energy-intensive industries, emission measurements of cities, energy price movement, and the impact of new energy vehicle.
Download or read book Nanotechnology and Precision Engineering written by Zheng Yi Jiang and published by Trans Tech Publications Ltd. This book was released on 2013-02-13 with total page 1050 pages. Available in PDF, EPUB and Kindle. Book excerpt: Selected, peer reviewed papers from the International Conference on Nanotechnology and Precision Engineering (ICNPE 2012), December 18-19, 2012, Guangzhou, China
Download or read book Machine Tool Metrology written by Graham T. Smith and published by Springer. This book was released on 2016-04-06 with total page 700 pages. Available in PDF, EPUB and Kindle. Book excerpt: Maximizing reader insights into the key scientific disciplines of Machine Tool Metrology, this text will prove useful for the industrial-practitioner and those interested in the operation of machine tools. Within this current level of industrial-content, this book incorporates significant usage of the existing published literature and valid information obtained from a wide-spectrum of manufacturers of plant, equipment and instrumentation before putting forward novel ideas and methodologies. Providing easy to understand bullet points and lucid descriptions of metrological and calibration subjects, this book aids reader understanding of the topics discussed whilst adding a voluminous-amount of footnotes utilised throughout all of the chapters, which adds some additional detail to the subject. Featuring an extensive amount of photographic-support, this book will serve as a key reference text for all those involved in the field.
Download or read book Measurement Technology and Intelligent Instruments XII written by Liang Chia Chen and published by Trans Tech Publications Ltd. This book was released on 2017-09-15 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: This special collection focuses on measurement science and metrology: micro- and nano-measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, industry and biomedicine, intelligent measuring instruments and systems for industry and transport, measurements of geometrical and mechanical quantities, measurements and metrology for humanitarian fields and education in measurement science. The aim was to present the current state and evolution of measuring technology and intelligent instruments, to highlight novel technologies for science, industry and engineering, and to spot promising ways towards further development, of new technologies for measurement, at the international level. The special collection was established following the results of the 12th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2015, September 22 - 25, 2015, Taipei, Taiwan).
Download or read book Quantum Nano Micro and Information Technologies written by Yuan Zhi Wang and published by Trans Tech Publications Ltd. This book was released on 2010-11-11 with total page 622 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters CPCI-S (WoS). The objective of this special collection was to provide a forum for researchers, educators, engineers and government officials, involved in the general areas of Quantum, Nano, Micro Technologies, mechatronics, robotics, automation, power and sensors, to present their latest research results and to exchange views on the future research paths in these fields.
Download or read book Dielectrics for Nanosystems 4 Materials Science Processing Reliability and Manufacturing written by Electrochemical society. Meeting and published by The Electrochemical Society. This book was released on 2010 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book American Journal of Physics written by and published by . This book was released on 2007 with total page 414 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach and published by William Andrew. This book was released on 2009-09-03 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge
