Download or read book Aberration Corrected Photoemission Electron Microscopy with Photonics Applications written by and published by . This book was released on 2015 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: Photoemission electron microscopy (PEEM) uses photoelectrons excited from material surfaces by incident photons to probe the interaction of light with surfaces with nanometer-scale resolution. The point resolution of PEEM images is strongly limited by spherical and chromatic aberration. Image aberrations primarily originate from the acceleration of photoelectrons and imaging with the objective lens and vary strongly in magnitude with specimen emission characteristics. Spherical and chromatic aberration can be corrected with an electrostatic mirror, and here I develop a triode mirror with hyperbolic geometry that has two adjacent, field-adjustable regions. I present analytic and numerical models of the mirror and show that the optical properties agree to within a few percent. When this mirror is coupled with an electron lens, it can provide a large dynamic range of correction and the coefficients of spherical and chromatic aberration can be varied independently. I report on efforts to realize a triode mirror corrector, including design, characterization, and alignment in our microscope at Portland State University (PSU). PEEM may be used to investigate optically active nanostructures, and we show that photoelectron emission yields can be identified with diffraction, surface plasmons, and dielectric waveguiding. Furthermore, we find that photoelectron micrographs of nanostructured metal and dielectric structures correlate with electromagnetic field calculations. We conclude that photoemission is highly spatially sensitive to the electromagnetic field intensity, allowing the direct visualization of the interaction of light with material surfaces at nanometer scales and over a wide range of incident light frequencies.

Download or read book Aberration corrected Imaging In Transmission Electron Microscopy An Introduction 2nd Edition written by Rolf Erni and published by World Scientific Publishing Company. This book was released on 2015-03-23 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Download or read book Aberration corrected Imaging In Transmission Electron Microscopy An Introduction written by Erni Rolf and published by World Scientific Publishing Company. This book was released on 2010-09-01 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction.The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy./a

Download or read book An Aberration Corrected Photoemission Electron Microscope at the Advanced Light Source written by M. Marcus and published by . This book was released on 2003 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light Source is outlined. PEEM3 will be installed on an elliptically polarized undulator beamline and will be used for the study of complex materials at high spatial and spectral resolution. The critical components of PEEM3 are the electron mirror aberration corrector and aberration-free magnetic beam separator. The models to calculate the optical properties of the electron mirror are discussed. The goal of the PEEM3 project is to achieve the highest possible transmission of the system at resolutions comparable to our present PEEM2 system (50 nm) and to enable significantly higher resolution, albeit at the sacrifice of intensity. We have left open the possibility to add an energy filter at a later date, if it becomes necessary driven by scientific need to improve the resolution further.

Download or read book Aberration Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and published by John Wiley & Sons. This book was released on 2011-08-02 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Download or read book Advances in Imaging and Electron Physics written by and published by Academic Press. This book was released on 2009-06-12 with total page 591 pages. Available in PDF, EPUB and Kindle. Book excerpt: The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. First book on the subject of correctors Well known contributors from academia and microscope manufacturers Provides an ideal starting point for preparing funding proposals

Download or read book An Aberration Corrected Photoemission Electron Microscope at the Advanced Light Source written by and published by . This book was released on 2004 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light Source is outlined. PEEM3 will be installed on an elliptically polarized undulator beamline and will be used for the study of complex materials at high spatial and spectral resolution. The critical components of PEEM3 are the electron mirror aberration corrector and aberration-free magnetic beam separator. The models to calculate the optical properties of the electron mirror are discussed. The goal of the PEEM3 project is to achieve the highest possible transmission of the system at resolutions comparable to the present PEEM2 system (50 nm) and to enable significantly higher resolution, albeit at the sacrifice of intensity. The authors have left open the possibility to add an energy filter at a later date, if it becomes necessary driven by scientific need to improve the resolution further.

Download or read book Advances in Imaging and Electron Physics written by and published by Academic Press. This book was released on 2013-09-07 with total page 253 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field

Download or read book Time resolved Photoemission Electron Microscopy written by Lukas Wittenbecher and published by . This book was released on 2021 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Image Contrast in Mirror and Low Energy Electron Microscopy written by Shane Michael Kennedy and published by . This book was released on 2010 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: We develop several approaches to understand and interpret image contrast in mirror electron microscopy (MEM) and low energy electron microscopy (LEEM), with potential applications to photoemission electron microscopy (PEEM). We treat both the forward problem, of how surface features and properties create image contrast, and the inverse problem, of how we may infer quantitative information about surface features and properties from experimental MEM, LEEM and PEEM images. The thesis begins with the development of the Laplacian imaging theory of MEM, whereby image contrast is understood as the second derivative of the surface topography, blurred slightly to account for the interaction of the electron beam with the electric field above the specimen, rather than the specimen surface itself. This intuitive method includes the effects of lens aberrations and can be rapidly inverted to recover the surface topography from experimental MEM images. For specimen surface variations that are outside the regime of the Laplacian imaging theory and other models, we develop a caustic imaging theory for MEM. This involves solving the electric field above the specimen and tracing a family or envelope of rays through the immersion lens. Where initially adjacent rays cross, caustics are created, and these strong image features may be used to recover three dimensional surface topography. Both the Laplacian imaging theory and the caustic imaging theory are successfully applied to experimental MEM data to obtain the surface topography. As a complement to this ray-based treatment, we then develop a wave optical treatment of LEEM image contrast, adopting the complex transfer function methodology from transmission electron microscopy. This method includes spherical and chromatic aberration, and may be extended to include higher order aberrations for use in aberration corrected LEEM instruments. With knowledge of the complex transfer function, we then apply phase retrieval methods to simulated LEEM images, recovering the electron wave function and surface topography for a series of step terraces. Finally, we consider a wave optical treatment of MEM, investigating the behaviour of the electron wave in the vicinity of the turn around region. This is extended to explore the application of MEM beyond specimen surfaces, and the feasibility of imaging very weak potentials, such as the ponderomotive potential experienced by an electron in a light field.

Download or read book Advances in Optical and Electron Microscopy written by T Mulvey and published by Academic Press. This book was released on 2017-07-14 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy. This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging. This publication is a beneficial to students and individuals researching on optical and electron microscopy.

Download or read book Aberration Corrected Analytical Transmission Electron Microscopy of Light Elements in Complex Oxides written by Dan Zhou and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advances in Imaging and Electron Physics written by Peter W. Hawkes and published by Academic Press. This book was released on 2011-08-08 with total page 409 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Invaluable reference and guide for physicists, engineers and mathematicians

Download or read book Electron and Ion Microscopy and Microanalysis written by Lawrence E Murr and published by CRC Press. This book was released on 2018-10-08 with total page 856 pages. Available in PDF, EPUB and Kindle. Book excerpt: The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Download or read book Scanning Electron Microscope Optics and Spectrometers written by Anjam Khursheed and published by World Scientific. This book was released on 2011 with total page 417 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.

Download or read book Coherent Electron Microscopy Designing Faster and Brighter Electron Sources written by Peter W. Hawkes and published by Elsevier. This book was released on 2023-08-17 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series

Download or read book Electron Optical Applications in Materials Science written by Lawrence Eugene Murr and published by . This book was released on 1970 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt: Problems after each chapter.