Download or read book Surface and Thin Film Analysis written by Gernot Friedbacher and published by John Wiley & Sons. This book was released on 2011-03-31 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Download or read book Spectroscopic Ellipsometry written by Hiroyuki Fujiwara and published by John Wiley & Sons. This book was released on 2007-09-27 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Download or read book Optical Materials written by Joseph H. Simmons and published by Academic Press. This book was released on 2000 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optical Materials presents, in a unified form, the underlying physical and structural processes that determine the optical behavior of materials. It does this by combining elements from physics, optics, and materials science in a seamless manner, and introducing quantum mechanics when needed. The book groups the characteristics of optical materials into classes with similar behavior. In treating each type of material, the text pays particular attention to atomic composition and chemical makeup, electronic states and band structure, and physical microstructure so that the reader will gain insight into the kinds of materials engineering and processing conditions that are required to produce a material exhibiting a desired optical property. The physical principles are presented on many levels, including a physical explanation, followed by formal mathematical support and examples and methods of measurement. The reader may overlook the equations with no loss of comprehension, or may use the text to find appropriate equations for calculations of optical properties. Presents the optical properties of metals, insulators, semiconductors, laser materials, and non-linear materials Physical processes are discussed and quantified using precise mathematical treatment, followed by examples and a discussion of measurement methods Authors combine many years of expertise in condensed matter physics, classical and quantum optics, and materials science The text is written on many levels and will benefit the novice as well as the expert Explains the concept of color in materials Explains the non-linear optical behavior of materials in a unified form Appendices present rigorous derivations
Download or read book Ellipsometry at the Nanoscale written by Maria Losurdo and published by Springer Science & Business Media. This book was released on 2013-03-12 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Download or read book Infrared Spectroscopic Ellipsometry written by Arnulf Röseler and published by VCH. This book was released on 1990 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Twenty fourth State of the Art Program on Compound Semiconductors written by F. Ren and published by The Electrochemical Society. This book was released on 1996 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook of Surface Plasmon Resonance written by Richard B. M. Schasfoort and published by Royal Society of Chemistry. This book was released on 2017-05-30 with total page 555 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface plasmon resonance (SPR) plays a dominant role in real-time interaction sensing of biomolecular binding events, this book provides a total system description including optics, fluidics and sensor surfaces for a wide researcher audience.
Download or read book Optical Characterization of Epitaxial Semiconductor Layers written by Günther Bauer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 446 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be performed on layers with thicknesses on the atomic scale. Furthermore, the spatial and temporal resolution have been pushed to such limits that real time observation of surface processes during epitaxial growth is possible with techniques like reflectance difference spectroscopy. Of course, optical spectroscopies complement techniques based on the inter action of electrons with matter, but whereas the latter usually require high or ultrahigh vacuum conditions, the former ones can be applied in different environments as well. This advantage could turn out extremely important for a rather technological point of view, i.e. for the surveillance of modern semiconductor processes. Despite the large potential of techniques based on the interaction of electromagnetic waves with surfaces and epilayers, optical techniques are apparently moving only slowly into this area of technology. One reason for this might be that some prejudices still exist regarding their sensitivity.
Download or read book Surface and Thin Film Analysis written by Gernot Friedbacher and published by Wiley-VCH. This book was released on 2011-06-07 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Download or read book Ellipsometry of Functional Organic Surfaces and Films written by Karsten Hinrichs and published by Springer Science & Business Media. This book was released on 2013-10-24 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Download or read book Nondestructive Characterization of Materials IV written by J.F. Bussière and published by Springer Science & Business Media. This book was released on 1992-02-29 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt: There is a great deal of interest in extending nondestructive technologies beyond the location and identification of cracks and voids. Specifically there is growing interest in the application of nondestructive evaluation (NOEl to the measurement of physical and mechanical properties of materials. The measurement of materials properties is often referred to as materials characterization; thus nondestructive techniques applied to characterization become nondestructive characterization (NDCl. There are a number of meetings, proceedings and journals focused upon nondestructive technologies and the detection and identification of cracks and voids. However, the series of symposia, of which these proceedings represent the fourth, are the only meetings uniquely focused upon nondestructive characterization. Moreover, these symposia are especially concerned with stimulating communication between the materials, mechanical and manufacturing engineer and the NDE technology oriented engineer and scientist. These symposia recognize that it is the welding of these areas of expertise that is necessary for practical development and application of NDC technology to measurements of components for in service life time and sensor technology for intelligent processing of materials. These proceedings are from the fourth international symposia and are edited by c.o. Ruud, J. F. Bussiere and R.E. Green, Jr. . The dates, places, etc of the symposia held to date area as follows: Symposia on Nondestructive Methods for TITLE: Material Property Determination DATES: April 6-8, 1983 PLACE: Hershey, PA, USA CHAIRPERSONS: C.O. Ruud and R.E. Green, Jr.
Download or read book Handbook of Advanced Nondestructive Evaluation written by Nathan Ida and published by Springer. This book was released on 2019-07-29 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This handbook is a comprehensive source of information on all aspects of non-destructive testing (NDT), for use by professionals, educators, and most of all, by the practitioners of testing. The art of NDT consists of dozens of methods, some classical, and some emerging. As the pace of industrial work and discovery intensifies and materials are utilized to their physical limits, the role of NDT becomes ever more important. As a result, the methods of testing are themselves evolving, and it is the intent of this book to capture this evolution. Handbook of Modern Non-Destructive Testing broadens the scope from traditional books on the subject. In addition to classical, emerging and exotic methods of evaluation, the book will also cover the use of NDT techniques in other fields, such as archaeology or resource exploration. With contributions from experts in all areas of the field, the reader will find balanced coverage of a variety of testing methods, with no bias against or endorsements of any particular method. The book treats many areas in depth, covering all aspects of testing, and will include case studies where appropriate. Additional coverage of statistical methods and their use, as well as simulations‘ role in testing and test design, are included.
Download or read book Optical Coherence Tomography written by Wolfgang Drexler and published by Springer Science & Business Media. This book was released on 2008-12-10 with total page 1346 pages. Available in PDF, EPUB and Kindle. Book excerpt: Optical coherence tomography (OCT) is the optical analog of ultrasound imaging and is emerging as a powerful imaging technique that enables non-invasive, in vivo, high resolution, cross-sectional imaging in biological tissue. This book introduces OCT technology and applications not only from an optical and technological viewpoint, but also from biomedical and clinical perspectives. The chapters are written by leading research groups, in a style comprehensible to a broad audience.
Download or read book Optical Characterization of Solids written by D. Dragoman and published by Springer Science & Business Media. This book was released on 2002 with total page 478 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gives a comprehensive and coherent account of the basic methods to characterize a solid through its interaction with an electromagnetic field.
Download or read book Plasmonics written by Ki Young Kim and published by BoD – Books on Demand. This book was released on 2012-10-24 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: The title of this book, Plasmonics: Principles and Applications, encompasses theory, technical issues, and practical applications which are of interest for diverse classes of the plasmonics. The book is a collection of the contemporary researches and developments in the area of plasmonics technology. It consists of 21 chapters that focus on interesting topics of modeling and computational methods, plasmonic structures for light transmission, focusing, and guiding, emerging concepts, and applications.
Download or read book Oxide Based Materials and Structures written by Rada Savkina and published by CRC Press. This book was released on 2020-05-07 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: Oxide-based materials and structures are becoming increasingly important in a wide range of practical fields including microelectronics, photonics, spintronics, power harvesting, and energy storage in addition to having environmental applications. This book provides readers with a review of the latest research and an overview of cutting-edge patents received in the field. It covers a wide range of materials, techniques, and approaches that will be of interest to both established and early-career scientists in nanoscience and nanotechnology, surface and material science, and bioscience and bioengineering in addition to graduate students in these areas. Features: Contains the latest research and developments in this exciting and emerging field Explores both the fundamentals and applications of the research Covers a wide range of materials, techniques, and approaches
