Download or read book Testing and Diagnosis of Analog Circuits and Systems written by Ruey-wen Liu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Download or read book Test and Diagnosis of Analogue Mixed signal and RF Integrated Circuits written by Yichuang Sun and published by IET. This book was released on 2008-05-30 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Download or read book Symbolic Analysis of Analog Circuits Techniques and Applications written by Lawrence P. Huelsman and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book brings together important contributions and state-of-the-art research results in the rapidly advancing area of symbolic analysis of analog circuits. It is also of interest to those working in analog CAD. The book is an excellent reference, providing insights into some of the most important issues in the symbolic analysis of analog circuits.
Download or read book Analog Circuits written by Yuping Wu and published by BoD – Books on Demand. This book was released on 2013-01-09 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: The invariable motif for analog design is to explore the new circuit topologies, architectures and CAD technologies to overcome the design challenges coming from the new applications and new fabrication technologies. In this book, a new architecture for a SAR ADC is proposed to eliminate the process mismatches and minimize the errors. A collection of DG-MOSFET based analog/RFICs present the excellent performance; the automated system for a passive filter circuits design is presented with the local searching engaging; interval analysis is used to solve some problems for linear and nonlinear analog circuits and a symbolic method is proposed to solve the testability problem.
Download or read book Proceedings of the 35th Midwest Symposium on Circuits and Systems written by George Washington University. Department of Electrical Engineering and Computer Science and published by Piscataway, NJ : Institute of Electrical and Electronics Engineers. This book was released on 1992 with total page 858 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings written by and published by . This book was released on 1983 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Defect Oriented Testing for CMOS Analog and Digital Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal
Download or read book Design of Analog Circuits Through Symbolic Analysis written by Mourad Fakhfakh and published by Bentham Science Publishers. This book was released on 2012-08-13 with total page 491 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Symbolic analyzers have the potential to offer knowledge to sophomores as well as practitioners of analog circuit design. Actually, they are an essential complement to numerical simulators, since they provide insight into circuit behavior which numerical "
Download or read book Analog RF and Mixed Signal Circuit Systematic Design written by Mourad Fakhfakh and published by Springer Science & Business Media. This book was released on 2013-02-03 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt: Despite the fact that in the digital domain, designers can take full benefits of IPs and design automation tools to synthesize and design very complex systems, the analog designers’ task is still considered as a ‘handcraft’, cumbersome and very time consuming process. Thus, tremendous efforts are being deployed to develop new design methodologies in the analog/RF and mixed-signal domains. This book collects 16 state-of-the-art contributions devoted to the topic of systematic design of analog, RF and mixed signal circuits. Divided in the two parts Methodologies and Techniques recent theories, synthesis techniques and design methodologies, as well as new sizing approaches in the field of robust analog and mixed signal design automation are presented for researchers and R/D engineers.
Download or read book 1986 IEEE International Symposium on Circuits and Systems Le Baron Hotel San Jose California May 5 7 1986 written by and published by . This book was released on 1986 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1874 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Variation Aware Analog Structural Synthesis written by Trent McConaghy and published by Springer Science & Business Media. This book was released on 2009-07-13 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes new tools for front end analog designers, starting with global variation-aware sizing, and extending to novel variation-aware topology design. The tools aid design through automation, but more importantly, they also aid designer insight through automation. We now describe four design tasks, each more general than the previous, and how this book contributes design aids and insight aids to each. The ?rst designer task targeted is global robust sizing. This task is supported by a design tool that does automated, globally reliable, variation-aware s- ing (SANGRIA),and an insight-aiding tool that extracts designer-interpretable whitebox models that relate sizings to circuit performance (CAFFEINE). SANGRIA searches on several levels of problem dif?culty simultaneously, from lower cheap-to-evaluate “exploration” layers to higher full-evaluation “exploitation” layers (structural homotopy). SANGRIAmakes maximal use of circuit simulations by performing scalable data mining on simulation results to choose new candidate designs. CAFFEINE accomplishes its task by tre- ing function induction as a tree-search problem. It constrains its tree search space via a canonical-functional-form grammar, and searches the space with grammatically constrained genetic programming. The second designer task is topology selection/topology design. Topology selection tools must consider a broad variety of topologies such that an app- priate topology is selected, must easily adapt to new semiconductor process nodes, and readily incorporate new topologies. Topology design tools must allow designers to creatively explore new topology ideas as rapidly as possible.
Download or read book Pathological Elements in Analog Circuit Design written by Mourad Fakhfakh and published by Springer. This book was released on 2018-03-23 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a compilation and a collection of tutorials and recent advances in the use of nullors (combinations of nullators and norators) and pathological mirrors in analog circuit and system design. It highlights the basic theory, trends and challenges in the field, making it an excellent reference resource for researchers and designers working in the synthesis, analysis, and design of analog integrated circuits. With its tutorial character, it can also be used for teaching. Singular elements such as nullors and pathological mirrors can arguably be considered as universal blocks since they can represent all existing analog building blocks, and they allow complex integrated circuits to be designed simply and effectively. These pathological elements are now used in a wide range of applications in modern circuit/system theory, and also in design practice.
Download or read book Defect Oriented Testing for Nano Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Download or read book Selected Papers on Analog Fault Diagnosis written by Ruey-Wen Liu and published by . This book was released on 1987 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Engineering Applications of Neural Networks written by Lazaros S. Iliadis and published by Springer Science & Business Media. This book was released on 2011-09-08 with total page 555 pages. Available in PDF, EPUB and Kindle. Book excerpt: The two-volume set IFIP AICT 363 and 364 constitutes the refereed proceedings of the 12th International Conference on Engineering Applications of Neural Networks, EANN 2011, and the 7th IFIP WG 12.5 International Conference, AIAI 2011, held jointly in Corfu, Greece, in September 2011. The 52 revised full papers and 28 revised short papers presented together with 31 workshop papers were carefully reviewed and selected from 150 submissions. The first volume includes the papers that were accepted for presentation at the EANN 2011 conference. They are organized in topical sections on computer vision and robotics, self organizing maps, classification/pattern recognition, financial and management applications of AI, fuzzy systems, support vector machines, learning and novel algorithms, reinforcement and radial basis function ANN, machine learning, evolutionary genetic algorithms optimization, Web applications of ANN, spiking ANN, feature extraction minimization, medical applications of AI, environmental and earth applications of AI, multi layer ANN, and bioinformatics. The volume also contains the accepted papers from the Workshop on Applications of Soft Computing to Telecommunication (ASCOTE 2011), the Workshop on Computational Intelligence Applications in Bioinformatics (CIAB 2011), and the Second Workshop on Informatics and Intelligent Systems Applications for Quality of Life Information Services (ISQLIS 2011).
