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Book A Practical Guide for the Preparation of Specimens for X Ray Fluorescence and X Ray Diffraction Analysis

Download or read book A Practical Guide for the Preparation of Specimens for X Ray Fluorescence and X Ray Diffraction Analysis written by Victor E. Buhrke and published by Wiley-VCH. This book was released on 1997-11-19 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first hands-on guide to XRD and XRF sampling and specimen preparation Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume. This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips. With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort. Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials * Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more * Features special chapters on specimen preparation equipment and XRF standards * Contains useful bibliography and helpful references.

Book Handbook of Practical X Ray Fluorescence Analysis

Download or read book Handbook of Practical X Ray Fluorescence Analysis written by Burkhard Beckhoff and published by Springer Science & Business Media. This book was released on 2007-05-18 with total page 897 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

Book A Practical Guide to Microstructural Analysis of Cementitious Materials

Download or read book A Practical Guide to Microstructural Analysis of Cementitious Materials written by Karen Scrivener and published by CRC Press. This book was released on 2018-10-09 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: A Practical Guide from Top-Level Industry Scientists As advanced teaching and training in the development of cementitious materials increase, the need has emerged for an up-to-date practical guide to the field suitable for graduate students and junior and general practitioners. Get the Best Use of Different Techniques and Interpretations of the Results This edited volume provides the cement science community with a state-of-the-art overview of analytical techniques used in cement chemistry to study the hydration and microstructure of cements. Each chapter focuses on a specific technique, not only describing the basic principles behind the technique, but also providing essential, practical details on its application to the study of cement hydration. Each chapter sets out present best practice, and draws attention to the limitations and potential experimental pitfalls of the technique. Databases that supply examples and that support the analysis and interpretation of the experimental results strengthen a very valuable ready reference. Utilizing the day-to-day experience of practical experts in the field, this book: Covers sample preparation issues Discusses commonly used techniques for identifying and quantifying the phases making up cementitious materials (X-ray diffraction and thermogravimetric analysis) Presents good practice oncalorimetry and chemical shrinkage methods for studying cement hydration kinetics Examines two different applications of nuclear magnetic resonance (solid state NMR and proton relaxometry) Takes a look at electron microscopy, the preeminent microstructural characterization technique for cementitious materials Explains how to use and interpret mercury intrusion porosimetry Details techniques for powder characterization of cementitious materials Outlines the practical application of phase diagrams for hydrated cements Avoid common pitfalls by using A Practical Guide to Microstructural Analysis of Cementitious Materials. A one-of-a-kind reference providing the do’s and don’ts of cement chemistry, the book presents the latest research and development of characterisation techniques for cementitious materials, and serves as an invaluable resource for practicing professionals specializing in cement and concrete materials and other areas of cement and concrete technology.

Book Handbook of Sample Preparation for Scanning Electron Microscopy and X Ray Microanalysis

Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Book Practical Guide to Materials Characterization

Download or read book Practical Guide to Materials Characterization written by Khalid Sultan and published by John Wiley & Sons. This book was released on 2022-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Guide to Materials Characterization Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner. To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements. Specific sample topics covered in the remaining seven chapters include: Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM) With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.

Book X Ray Diffraction

    Book Details:
  • Author : Oliver H. Seeck
  • Publisher : CRC Press
  • Release : 2015-02-10
  • ISBN : 9814303607
  • Pages : 438 pages

Download or read book X Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Book X Ray Fluorescence Spectroscopy for Laboratory Applications

Download or read book X Ray Fluorescence Spectroscopy for Laboratory Applications written by Michael Haschke and published by John Wiley & Sons. This book was released on 2021-04-05 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.

Book X Ray Fluorescence Spectrometry

Download or read book X Ray Fluorescence Spectrometry written by Ron Jenkins and published by John Wiley & Sons. This book was released on 2012-08-29 with total page 1 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade. Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra. Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application. Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science. An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes: The history of X-ray fluorescence spectrometry-new to this edition. A critical review of the most useful X-ray spectrometers. Techniques and procedures for quantitative and qualitative analysis. Modern applications and industrial trends. X-ray spectra-new to this edition.

Book X Ray Fluorescence Spectrometry and Related Techniques

Download or read book X Ray Fluorescence Spectrometry and Related Techniques written by Eva Margui and published by Momentum Press. This book was released on 2013-01-25 with total page 149 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

Book Structure Determination by X Ray Crystallography

Download or read book Structure Determination by X Ray Crystallography written by M. F. C. Ladd and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystallography may be described as the science of the structure of materi als, using this word in its widest sense, and its ramifications are apparent over a broad front of current scientific endeavor. It is not surprising, therefore, to find that most universities offer some aspects of crystallography in their undergraduate courses in the physical sciences. It is the principal aim of this book to present an introduction to structure determination by X-ray crystal lography that is appropriate mainly to both final-year undergraduate studies in crystallography, chemistry, and chemical physics, and introductory post graduate work in this area of crystallography. We believe that the book will be of interest in other disciplines, such as physics, metallurgy, biochemistry, and geology, where crystallography has an important part to play. In the space of one book, it is not possible either to cover all aspects of crystallography or to treat all the subject matter completely rigorously. In particular, certain mathematical results are assumed in order that their applications may be discussed. At the end of each chapter, a short bibliog raphy is given, which may be used to extend the scope of the treatment given here. In addition, reference is made in the text to specific sources of information. We have chosen not to discuss experimental methods extensively, as we consider that this aspect of crystallography is best learned through practical experience, but an attempt has been made to simulate the interpretive side of experimental crystallography in both examples and exercises.

Book High Resolution X Ray Diffractometry And Topography

Download or read book High Resolution X Ray Diffractometry And Topography written by D.K. Bowen and published by CRC Press. This book was released on 1998-02-05 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization

Book Proceedings of the 10th International Congress for Applied Mineralogy  ICAM

Download or read book Proceedings of the 10th International Congress for Applied Mineralogy ICAM written by Maarten A.T.M. Broekmans and published by Springer Science & Business Media. This book was released on 2012-03-20 with total page 805 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book comprises 96 peer-reviewed contributions submitted to the 10th ICAM Congress, held in Trondheim, Norway on 01-05 August 2011. Themes covered include: 1) Advanced materials, including high-performance technical ceramics and glasses, 2) Analytical techniques, instrumentation and automation, 3) Bio-mimetic mineral materials, medical mineralogy, 4) Construction materials including cement/SCMs, concrete, bricks, tiles, screeds, 5) Cultural heritage, stone artifacts and preservation, 6) Environment and energy mineralogy, including CO2 sequestration, 7) Geometallurgy and process mineralogy, and 8) Industrial minerals including gems, ore minerals, and mineral exploration.

Book Practical Materials Characterization

Download or read book Practical Materials Characterization written by Mauro Sardela and published by Springer. This book was released on 2014-07-10 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Book The Oxford Handbook of Archaeological Ceramic Analysis

Download or read book The Oxford Handbook of Archaeological Ceramic Analysis written by Alice M. W. Hunt and published by Oxford University Press. This book was released on 2017 with total page 777 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume draws together topics and methodologies essential for the socio-cultural, mineralogical, and geochemical analysis of archaeological ceramic, one of the most complex and ubiquitous archaeomaterials in the archaeological record. It provides an invaluable resource for archaeologists, anthropologists, and archaeological materials scientists.

Book X Ray Fluorescence in Biological Sciences

Download or read book X Ray Fluorescence in Biological Sciences written by Vivek K. Singh and published by John Wiley & Sons. This book was released on 2022-04-11 with total page 692 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray Fluorescence in Biological Sciences Discover a comprehensive exploration of X-ray fluorescence in chemical biology and the clinical and plant sciences In X-Ray Fluorescence in Biological Sciences: Principles, Instrumentation, and Applications, a team of accomplished researchers delivers extensive coverage of the application of X-ray fluorescence (XRF) in the biological sciences, including chemical biology, clinical science, and plant science. The book also explores recent advances in XRF imaging techniques in these fields. The authors focus on understanding and investigating the intercellular structures and metals in plant cells, with advanced discussions of recently developed micro-analytical methods, like energy dispersive X-ray fluorescence spectrometry (EDXRF), total reflection X-ray fluorescence spectrometry (TXRF), micro-proton induced X-ray emission (micro-PIXE), electron probe X-ray microanalysis (EPXMA), synchrotron-based X-ray fluorescence microscopy (SXRF, SRIXE, or micro-XRF) and secondary ion mass spectrometry (SIMS). With thorough descriptions of protocols and practical approaches, the book also includes: A thorough introduction to the historical background and fundamentals of X-ray fluorescence, as well as recent developments in X-ray fluorescence analysis Comprehensive explorations of the general properties, production, and detection of X-rays and the preparation of samples for X-ray fluorescence analysis Practical discussions of the quantification of prepared samples observed under X-ray fluorescence and the relation between precision and beam size and sample amount In-depth examinations of wavelength-dispersive X-ray fluorescence and living materials Perfect for students and researchers studying the natural and chemical sciences, medical biology, plant physiology, agriculture, and botany, X-Ray Fluorescence in Biological Sciences: Principles, Instrumentation, and Applications will also earn a place in the libraries of researchers at biotechnology companies.

Book Elemental Analysis

    Book Details:
  • Author : Gerhard Schlemmer
  • Publisher : Walter de Gruyter GmbH & Co KG
  • Release : 2019-08-05
  • ISBN : 3110498324
  • Pages : 558 pages

Download or read book Elemental Analysis written by Gerhard Schlemmer and published by Walter de Gruyter GmbH & Co KG. This book was released on 2019-08-05 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: Elemental Analysis is an excellent guide introducing cutting-edge methods for the qualitative and quantitative analysis of elements. Each chapter of the book gives an overview of a certain technique, such as AAS, AFS, ICP-OES, MIP-OES, ICP-MS and XRF. Readers will benefit from a balanced combination of theoretical basics, operational principles of instruments and their practical applications.

Book Thin Film Analysis by X Ray Scattering

Download or read book Thin Film Analysis by X Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.