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Book Advanced MEMS Packaging

Download or read book Advanced MEMS Packaging written by John H. Lau and published by McGraw Hill Professional. This book was released on 2009-10-22 with total page 577 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive guide to 3D MEMS packaging methods and solutions Written by experts in the field, Advanced MEMS Packaging serves as a valuable reference for those faced with the challenges created by the ever-increasing interest in MEMS devices and packaging. This authoritative guide presents cutting-edge MEMS (microelectromechanical systems) packaging techniques, such as low-temperature C2W and W2W bonding and 3D packaging. This definitive resource helps you select reliable, creative, high-performance, robust, and cost-effective packaging techniques for MEMS devices. The book will also aid in stimulating further research and development in electrical, optical, mechanical, and thermal designs as well as materials, processes, manufacturing, testing, and reliability. Among the topics explored: Advanced IC and MEMS packaging trends MEMS devices, commercial applications, and markets More than 360 MEMS packaging patents and 10 3D MEMS packaging designs TSV for 3D MEMS packaging MEMS wafer thinning, dicing, and handling Low-temperature C2C, C2W, and W2W bonding Reliability of RoHS-compliant MEMS packaging Micromachining and water bonding techniques Actuation mechanisms and integrated micromachining Bubble switch, optical switch, and VOA MEMS packaging Bolometer and accelerameter MEMS packaging Bio-MEMS and biosensor MEMS packaging RF MEMS switches, tunable circuits, and packaging

Book Mems Packaging

Download or read book Mems Packaging written by Yung-cheng Lee and published by World Scientific. This book was released on 2018-01-03 with total page 363 pages. Available in PDF, EPUB and Kindle. Book excerpt: MEMS sensors and actuators are enabling components for smartphones, AR/VR, and wearable electronics. MEMS packaging is recognized as one of the most critical activities to design and manufacture reliable MEMS. A unique challenge to MEMS packaging is how to protect moving MEMS devices during manufacturing and operation. With the introduction of wafer level capping and encapsulation processes, this barrier is removed successfully. In addition, MEMS devices should be integrated with their electronic chips with the smallest footprint possible. As a result, 3D packaging is applied to connect the devices vertically for the most effective integration. Such 3D packaging also paves the way for further heterogenous integration of MEMS devices, electronics, and other functional devices.This book consists of chapters written by leaders developing products in a MEMS industrial setting and faculty members conducting research in an academic setting. After an introduction chapter, the practical issues are covered: through-silicon vias (TSVs), vertical interconnects, wafer level packaging, motion sensor-to-CMOS bonding, and use of printed circuit board technology to fabricate MEMS. These chapters are written by leaders developing MEMS products. Then, fundamental issues are discussed, topics including encapsulation of MEMS, heterogenous integration, microfluidics, solder bonding, localized sealing, microsprings, and reliability.

Book Advanced Packaging and Manufacturing Technology Based on Adhesion Engineering

Download or read book Advanced Packaging and Manufacturing Technology Based on Adhesion Engineering written by Seonho Seok and published by Springer. This book was released on 2019-01-05 with total page 115 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces microelectromechanical systems (MEMS) packaging utilizing polymers or thin films – a new and unique packaging technology. It first investigates the relationship between applied load and opening displacement as a function of benzocyclobutene (BCB) cap size to find the debonding behavior, and then presents BCB cap deformation and stress development at different opening displacements as a function of BCB thickness, which is a criterion for BCB cap transfer failure. Transfer packaging techniques are attracting increasing interest because they deliver packaging caps, from carrier wafers to device wafers, and minimize the fabrication issues frequently encountered in thin-film or polymer cap encapsulation. The book describes very-low-loss polymer cap or thin-film-transfer techniques based on anti-adhesion coating methods for radio frequency (RF) (-MEMS) device packaging. Since the polymer caps are susceptible to deformation due to their relatively low mechanical stiffness during debonding of the carrier wafer, the book develops an appropriate finite element model (FEM) to simulate the debonding process occurring in the interface between Si carrier wafer and BCB cap. Lastly, it includes the load–displacement curve of different materials and presents a flexible polymer filter and a tunable filter as examples of the applications of the proposed technology.

Book Wafer Level Hermetic Seal Process for Microelectromechanical Systems MEMS Devices

Download or read book Wafer Level Hermetic Seal Process for Microelectromechanical Systems MEMS Devices written by Lee-Chuan Tseng and published by . This book was released on 2020-12-05 with total page 26 pages. Available in PDF, EPUB and Kindle. Book excerpt: A microelectromechanical systems (MEMS) structure with a cavity hermetically sealed using a mask layer is provided. A capping substrate is arranged over a MEMS substrate, which includes a movable element. The capping substrate includes the cavity arranged over and opening to the movable element, and includes a seal opening in fluid communication with the cavity. The mask layer is arranged over the capping substrate. The mask layer overhangs the seal opening and laterally surrounds a mask opening arranged over the seal opening. A seal layer is arranged over the mask layer and the mask opening. The seal layer is configured to hermetically seal the cavity. A method for manufacturing the MEMS structure is also provided.

Book Fan Out Wafer Level Packaging

Download or read book Fan Out Wafer Level Packaging written by John H. Lau and published by Springer. This book was released on 2018-04-05 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive guide to fan-out wafer-level packaging (FOWLP) technology compares FOWLP with flip chip and fan-in wafer-level packaging. It presents the current knowledge on these key enabling technologies for FOWLP, and discusses several packaging technologies for future trends. The Taiwan Semiconductor Manufacturing Company (TSMC) employed their InFO (integrated fan-out) technology in A10, the application processor for Apple’s iPhone, in 2016, generating great excitement about FOWLP technology throughout the semiconductor packaging community. For many practicing engineers and managers, as well as scientists and researchers, essential details of FOWLP – such as the temporary bonding and de-bonding of the carrier on a reconstituted wafer/panel, epoxy molding compound (EMC) dispensing, compression molding, Cu revealing, RDL fabrication, solder ball mounting, etc. – are not well understood. Intended to help readers learn the basics of problem-solving methods and understand the trade-offs inherent in making system-level decisions quickly, this book serves as a valuable reference guide for all those faced with the challenging problems created by the ever-increasing interest in FOWLP, helps to remove roadblocks, and accelerates the design, materials, process, and manufacturing development of key enabling technologies for FOWLP.

Book Polymer based Wafer level Packaging of Micromachined HARPSS Devices

Download or read book Polymer based Wafer level Packaging of Micromachined HARPSS Devices written by Pezhman Monadgemi and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis reports on a new low-cost wafer-level packaging technology for microelectromechanical systems (MEMS). The MEMS process is based on a revised version of High Aspect Ratio Polysilicon and Single Crystal Silicon (HARPSS) technology. The packaging technique is based on thermal decomposition of a sacrificial polymer through a polymer overcoat followed by metal coating to create resizable MEMS packages. The sacrificial polymer is created on top of the active component including beams, seismic mass, and electrodes by photodefining, dispensing, etching, or molding. The low loss polymer overcoat is patterned by photodefinition to provide access to the bond pads. The sacrificial polymer decomposes at temperatures around 200-280aC and the volatile products permeate through the overcoat polymer leaving an embedded air-cavity. For MEMS devices that do not need hermetic packaging, the encapsulated device can then be handled and packaged like an integrated circuit. For devices that are sensitive to humidity or need vacuum environment, hermiticity is obtained by deposition and patterning thin-film metals such as aluminum, chromium, copper, or gold. To demonstrate the potential of this technology, different types of capacitive MEMS devices have been designed, fabricated, packaged, and characterized. These includes beam resonators, RF tunable capacitors, accelerometers, and gyroscopes. The MEMS design includes mechanical, thermal, and electromagnetic analysis. The device performance, before and after packaging is compared and the correlation to the model is presented. The following is a summary of the main contributions of this work to the extensive research focused on MEMS and their packaging: 1)A new low-cost wafer-level packaging method for bulk or surface micromachined devices including resonators, RF passives and mechanical sensors is reported. This technique utilizes thermal decomposition of a sacrificial polymer through an overcoat polymer to create buried channels on top of the resonant/movable parts of the micromachined device. It provides small interconnections together with resizable package dimensions. We report MEMS package thicknesses in the range of 10 mm to 1 mm, and package size from 0.0001 mm^2 to 1 mm^2. 2)A revised version of the HARPSS technology is presented to implement high aspect ratio silicon capacitors, resonators and inertial sensors in the smallest area.

Book Hermeticity Testing of MEMS and Microelectronic Packages

Download or read book Hermeticity Testing of MEMS and Microelectronic Packages written by Suzanne Costello and published by Artech House. This book was released on 2013-10-01 with total page 197 pages. Available in PDF, EPUB and Kindle. Book excerpt: Packaging of microelectronics has been developing since the invention of the transistor in 1947. With the increasing complexity and decreasing size of the die, packaging requirements have continued to change. A step change in package requirements came with the introduction of the Micro-Electro-Mechanical System (MEMS) whereby interactions with the external environment are, in some cases, required. This resource is a rapid, definitive reference on hermetic packaging for the MEMS and microelectronics industry, giving practical guidance on traditional and newly developed test methods. This book includes up-to-date and applicable test methods for today’s package types. The authors cover the history and development of packaging, along with a view to understanding initial hermeticity testing requirements and the subsequent limitations of these methods when applied to new package types.

Book Robust Hermetic Packaging Techniques for MEMS Integrated Microsystems

Download or read book Robust Hermetic Packaging Techniques for MEMS Integrated Microsystems written by Andrew David Oliver and published by . This book was released on 2005 with total page 27 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work is the result of a Sandia National Laboratories LDRD funded fellowship at the University of Michigan. Although, guidance and suggestions were offered by Sandia, the work contained here is primarily the work of Brian H. Stark, and his advisor, Professor Khalil Najafi. Junseok Chae, Andrew Kuo, and their coworkers at the University of Michigan helped to record some of the data. The following is an abstract of their work. We have developed a vacuum packaging technology using a thick nickel film to seal MEMS structures at the wafer level. The package is fabricated in a three-mask process by electroplating a 40 micro-meter thick nickel film over an 8 micro-meter sacrificial photoresist that is removed prior to package sealing. Implementation of electrical feedthroughs in this process requires no planarization. The large release channel enables an 800x800 micro-meter package to be released in less than three hours. Several mechanisms, based upon localized melting and lead/tin solder bumping, for sealing the release channel have been investigated. We have also developed Pirani gauges, integrated with this package, which can be used to establish the hermeticity of the different sealing technologies. They have measured a sealing pressure of approximately 1.5 Torr. Our work differs from previous Pirani gauges in that we utilize a novel doubly anchored structure that stiffens the structural membrane while not substantially degrading performance in order to measure fine leak rates.

Book Wafer Level Chip Scale Packaging

Download or read book Wafer Level Chip Scale Packaging written by Shichun Qu and published by Springer. This book was released on 2014-09-10 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analog and Power Wafer Level Chip Scale Packaging presents a state-of-art and in-depth overview in analog and power WLCSP design, material characterization, reliability and modeling. Recent advances in analog and power electronic WLCSP packaging are presented based on the development of analog technology and power device integration. The book covers in detail how advances in semiconductor content, analog and power advanced WLCSP design, assembly, materials and reliability have co-enabled significant advances in fan-in and fan-out with redistributed layer (RDL) of analog and power device capability during recent years. Since the analog and power electronic wafer level packaging is different from regular digital and memory IC package, this book will systematically introduce the typical analog and power electronic wafer level packaging design, assembly process, materials, reliability and failure analysis, and material selection. Along with new analog and power WLCSP development, the role of modeling is a key to assure successful package design. An overview of the analog and power WLCSP modeling and typical thermal, electrical and stress modeling methodologies is also presented in the book.

Book Development and Characterization of a Wafer scale Packaging Technique for Stable Large Lateral Deflection MEMS

Download or read book Development and Characterization of a Wafer scale Packaging Technique for Stable Large Lateral Deflection MEMS written by Matthew William Messana and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Microelectromechanical systems (MEMS) are very popular in our everyday lives. They are becoming more ubiquitous, showing in automobiles, cell phones, projectors, toys and many other places. The packaging of these devices is critical to their performance and reliability and must be carefully considered in their overall system design. Due to strict requirements and the fragile nature of these devices, the packaging often represents a significant portion of the total cost of a MEMS product. Stanford University, jointly with Bosch, developed a wafer-scale encapsulation method in which MEMS devices are encapsulated as a part of their fabrication. This process, now used by SiTime, has been dubbed the 'epi-seal' process by virtue of its use of an epitaxial silicon reactor to seal the cavities containing the devices. The MEMS devices are cleaned in situ in the epitaxial silicon reactor just prior to sealing with silicon, resulting in a package environment that is very clean and stable. Because this is a batch process, the overall packaged device cost is very low. One significant limitation with this process, however, is that devices are limited to small (less than 2[Mu]m) trenches, thus prohibiting large displacements and the use of common MEMS structures such as comb drives. In this dissertation, I will discuss two methods for expanding the design rules of the epi-seal process to include large lateral deflection structures, while still maintaining the desirable qualities of the original process. The first method employs a thick SiO2 deposition and its subsequent planarization to fill in all of the large trenches. The second method involves fusion bonding a sacrificial wafer to a silicon-on-insulator (SOI) wafer, in which devices are already etched, bridging over the trenches. The sacrificial wafer is thinned via grinding and polishing, similar to the fabrication of an SOI. Cavities are vented through the thinned wafer and devices released using HF vapor. Like the epi-seal process, the devices are then cleaned and sealed in the epitaxial silicon reactor for both of these processes. Many widely varying devices were produced using this process in the Stanford Nanofabrication Facility (SNF) with high yield. I will discuss some of these devices and how we used them to characterize the packaging.

Book MEMS MOEM Packaging

Download or read book MEMS MOEM Packaging written by Ken Gilleo and published by McGraw Hill Professional. This book was released on 2005-08-01 with total page 239 pages. Available in PDF, EPUB and Kindle. Book excerpt: While MEMS technology has progressed rapidly, commercialization of MEMS has been hindered by packaging technology barriers and costs. One of the key issues in the industrialization of MEMS, MOEM and ultimately Nanoelectrical devices is the development of appropriate packaging solutions for the protection, assembly, and long term reliable operation. This book rigorously examines the properties of the materials used in MEMS and MOEN assembly then evaluates them in terms of their routing, electrical performance, thermal management and reliability. With this as a starting point, the book moves on to discuss advanced packaging methods such as: molded thermoplastic packages for MEMS, wafer-assembled RFID, and wafer-level stacked packaging.

Book Methods for the Wafer scale Encapsulation of MEMS

Download or read book Methods for the Wafer scale Encapsulation of MEMS written by Andrew Blake Graham and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The packaging of microelectromechanical systems (MEMS) is one of the most important design considerations in taking a product from a research environment to a commercial application. It must not only provide a suitably clean and stable environment for the device, but it should also withstand any harsh post-processing steps (such as wafer dicing and wire bonding) needed to integrate the device into its final system. As a result, the cost of packaging is typically a large portion of the overall cost of any commercial MEMS product. Addressing these needs for electrostatic silicon MEMS, this work describes the development of multiple wafer-scale encapsulation techniques that allow for a wide range of devices to be fabricated in a single fabrication process. Expanding on the thin film, 'epi-seal' encapsulation technique developed jointly by Stanford University and Bosch, a packaging method was developed that makes use of a thick sacrificial oxide deposition and subsequent planarization to allow for large lateral deflection structures side-by-side with proven narrow gap devices, such as tuning fork resonators. In an effort to further increase the capabilities of wafer-scale encapsulation, a process combining fusion wafer bonding and epitaxial reactor sealing was also developed. Unlike many packaging techniques using wafer bonding, the overall package size is only slightly bigger than the device itself and results in a stable, clean environment for the device. The final encapsulated part consists of a single crystal silicon structure free of native oxide inside a single crystal silicon cap layer. In addition, this encapsulation can support numerous process variations, such as oxide-coated composite device structures and the first MEMS devices packaged at the wafer scale using the surface migration of silicon atoms.

Book Advanced MEMS Packaging

Download or read book Advanced MEMS Packaging written by and published by . This book was released on 2010 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: