Download or read book A Highly Efficient Redundancy Scheme Self purging Redundancy written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1975 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: The goals of this paper are to present an efficient redundancy scheme for highly reliable systems, to give a method to compute the exact reliability of such schemes and to compare this scheme with other redundancy schemes. This redundancy scheme is self-purging redundancy; a scheme that uses a threshold voter and that purges the failed modules. Switches for self-purging systems are extremely simple: there is no replacement of failed modules and module purging is quite simply implemented. Because of switch simplicity, exact reliability calculations are possible. The effects of switch reliability are quantitatively examined. For short mission times, switch reliability is the most important factor: self-purging systems have a probability of failure several times larger than the figure obtained when switches are assumed to be perfect. The influence of the relative frequency of the diverse types of failures (permanent, intermittent, stuck-at,...) are also investigated. Reliability functions, mission time improvements and switch efficiency are displayed. Self-purging systems are compared with ot her redundant systems, like hybrid or NMR, for their relative merits in reliability gain, simplicity, cost and confidence in the reliability estimation. The high confidence in the reliability evaluation of self-purging systems makes them a standard for the validation of several models that have been proposed to take into account switch reliability. The accuracy of models using coverage factors can be evaluated that way.
Download or read book Applied Reliability and Quality written by Balbir S. Dhillon and published by Springer Science & Business Media. This book was released on 2007-02-23 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Each industry, from robotics to health care, power generation to software, has its own tailored reliability and quality principles, methods, and procedures. This book brings these together so that reliability and quality professionals can more easily learn about each other's work, which may help them, directly or indirectly, to perform their tasks more effectively.
Download or read book NBS Special Publication written by and published by . This book was released on 1978 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Predictably Dependable Computing Systems written by Brian Randell and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 592 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Radiation Tolerant Electronics written by Paul Leroux and published by MDPI. This book was released on 2019-08-26 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
Download or read book Dependable Computing for Critical Applications written by Algirdas Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Working Conference on Dependable Computing for Critical Applications was the first conference organized by IFIP Working Group 10. 4 "Dependable Computing and Fault Tolerance", in cooperation with the Technical Committee on Fault-Tolerant Computing of the IEEE Computer Society, and the Technical Committee 7 on Systems Reliability, Safety and Security of EWlCS. The rationale for the Working Conference is best expressed by the aims of WG 10. 4: " Increasingly, individuals and organizations are developing or procuring sophisticated computing systems on whose services they need to place great reliance. In differing circumstances, the focus will be on differing properties of such services - e. g. continuity, performance, real-time response, ability to avoid catastrophic failures, prevention of deliberate privacy intrusions. The notion of dependability, defined as that property of a computing system which allows reliance to be justifiably placed on the service it delivers, enables these various concerns to be subsumed within a single conceptual framework. Dependability thus includes as special cases such attributes as reliability, availability, safety, security. The Working Group is aimed at identifying and integrating approaches, methods and techniques for specifying, designing, building, assessing, validating, operating and maintaining computer systems which should exhibit some or all of these attributes. " The concept of WG 10. 4 was formulated during the IFIP Working Conference on Reliable Computing and Fault Tolerance on September 27-29, 1979 in London, England, held in conjunction with the Europ-IFIP 79 Conference. Profs A. Avi~ienis (UCLA, Los Angeles, USA) and A.
Download or read book Computer Science Handbook written by Allen B. Tucker and published by CRC Press. This book was released on 2004-06-28 with total page 2742 pages. Available in PDF, EPUB and Kindle. Book excerpt: When you think about how far and fast computer science has progressed in recent years, it's not hard to conclude that a seven-year old handbook may fall a little short of the kind of reference today's computer scientists, software engineers, and IT professionals need. With a broadened scope, more emphasis on applied computing, and more than 70 chap
Download or read book Dependability in Electronic Systems written by Nobuyasu Kanekawa and published by Springer Science & Business Media. This book was released on 2010-11-08 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability.
Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.
Download or read book The Evolution of Fault Tolerant Computing written by A. Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 467 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Download or read book Control Systems Readiness for Munitions Plants written by Theodore Joseph Williams and published by . This book was released on 1978 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliable Computer Systems written by Daniel P. Siewiorek and published by CRC Press. This book was released on 1998-12-15 with total page 908 pages. Available in PDF, EPUB and Kindle. Book excerpt: This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Download or read book Wafer Scale Integration written by Earl E. Swartzlander Jr. and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 515 pages. Available in PDF, EPUB and Kindle. Book excerpt: Wafer Scale Integration (WSI) is the culmination of the quest for larger integrated circuits. In VLSI chips are developed by fabricating a wafer with hundreds of identical circuits, testing the circuits, dicing the wafer, and packaging the good dice. In contrast in WSI, a wafer is fabricated with several types of circuits (generally referred to as cells), with multiple instances of each cell type, the cells are tested, and good cells are interconnected to realize a system on the wafer. Since most signal lines stay on the wafer, stray capacitance is low, so that high speeds are achieved with low power consumption. For the same technology a WSI implementation may be a factor of five faster, dissipate a factor of ten less power, and require one hundredth to one thousandth the volume. Successful development of WSI involves many overlapping disciplines, ranging from architecture to test design to fabrication (including laser linking and cutting, multiple levels of interconnection, and packaging). This book concentrates on the areas that are unique to WSI and that are as a result not well covered by any of the many books on VLSI design. A unique aspect of WSI is that the finished circuits are so large that there will be defects in some portions of the circuit. Accordingly much attention must be devoted to designing architectures that facilitate fault detection and reconfiguration to of WSI include fabrication circumvent the faults. Other unique aspects technology and packaging.
Download or read book Spectral Techniques and Fault Detection written by Marg Karpovsky and published by Elsevier. This book was released on 2012-12-02 with total page 619 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.
Download or read book Reliable Computer Systems written by Daniel Siewiorek and published by Digital Press. This book was released on 2014-06-28 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Download or read book Instrument and Automation Engineers Handbook written by Bela G. Liptak and published by CRC Press. This book was released on 2022-08-31 with total page 3560 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Instrument and Automation Engineers’ Handbook (IAEH) is the Number 1 process automation handbook in the world. The two volumes in this greatly expanded Fifth Edition deal with measurement devices and analyzers. Volume one, Measurement and Safety, covers safety sensors and the detectors of physical properties, while volume two, Analysis and Analysis, describes the measurement of such analytical properties as composition. Complete with 245 alphabetized chapters and a thorough index for quick access to specific information, the IAEH, Fifth Edition is a must-have reference for instrument and automation engineers working in the chemical, oil/gas, pharmaceutical, pollution, energy, plastics, paper, wastewater, food, etc. industries.
Download or read book Measurement and Safety written by Béla G. Lipták and published by CRC Press. This book was released on 2016-11-25 with total page 3643 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Instrument and Automation Engineers’ Handbook (IAEH) is the #1 process automation handbook in the world. Volume one of the Fifth Edition, Measurement and Safety, covers safety sensors and the detectors of physical properties. Measurement and Safety is an invaluable resource that: Describes the detectors used in the measurement of process variables Offers application- and method-specific guidance for choosing the best measurement device Provides tables of detector capabilities and other practical information at a glance Contains detailed descriptions of domestic and overseas products, their features, capabilities, and suppliers, including suppliers’ web addresses Complete with 163 alphabetized chapters and a thorough index for quick access to specific information, Measurement and Safety is a must-have reference for instrument and automation engineers working in the chemical, oil/gas, pharmaceutical, pollution, energy, plastics, paper, wastewater, food, etc. industries. About the eBook The most important new feature of the IAEH, Fifth Edition is its availability as an eBook. The eBook provides the same content as the print edition, with the addition of thousands of web addresses so that readers can reach suppliers or reference books and articles on the hundreds of topics covered in the handbook. This feature includes a complete bidders' list that allows readers to issue their specifications for competitive bids from any or all potential product suppliers.
