Download or read book 2000 Ieee International Reliability Physics Symposium Proceedings 38th Annual written by Ieee and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 2000 IEEE International Reliability Physics Symposium written by and published by . This book was released on 2000 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IEEE International Reliability Physics Symposium 2000 written by IEEE, Electron Devices Society and Reliability Society Staff and published by . This book was released on 2000 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IEEE International Reliability Physics Symposium 2000 written by IEEE and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000-05 with total page 466 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IEEE International Reliability Physics Symposium Proceedings written by International Reliability Physics Symposium and published by . This book was released on 2002 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Physics and Engineering written by J. W. McPherson and published by Springer. This book was released on 2018-12-20 with total page 469 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.

Download or read book 2000 IEEE International Reliability Physics Symposium written by IEEE and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000-10 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability Physics Symposium 2002 IEEE International written by International Reliability Physics Symposium and published by . This book was released on 2002-01-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Special Issue on the 2009 International Reliability Physics Symposium written by International Reliability Physics Symposium. 47, 2009, Montréal and published by . This book was released on 2009 with total page 70 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Oxide Reliability written by D. J. Dumin and published by World Scientific. This book was released on 2002 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presents in summary the state of our knowledge of oxide reliability.

Download or read book 27th Annual Proceedings International Reliability Physics Symposium written by and published by . This book was released on 1989 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Reliability and Risk Issues in Large Scale Safety critical Digital Control Systems written by Poong-Hyun Seong and published by Springer Science & Business Media. This book was released on 2008-10-25 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt: “Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems” provides a comprehensive coverage of reliability issues and their corresponding countermeasures in the field of large-scale digital control systems, from the hardware and software in digital systems to the human operators who supervise the overall process of large-scale systems. Unlike other books which examine theories and issues in individual fields, this book reviews important problems and countermeasures across the fields of software reliability, software verification and validation, digital systems, human factors engineering and human reliability analysis. Divided into four sections dealing with software reliability, digital system reliability, human reliability and human operators in large-scale digital systems, the book offers insights from professional researchers in each specialized field in a diverse yet unified approach.

Download or read book 23rd International Reliability Physics Symposium written by and published by . This book was released on 1985 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Thermally Aware Design written by Yong Zhan and published by Now Publishers Inc. This book was released on 2008 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides an overview of analysis and optimization techniques for thermally-aware chip design.

Download or read book The ESD Handbook written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2021-03-25 with total page 1172 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.

Download or read book Reliability Assessments written by Franklin Richard Nash, Ph.D. and published by CRC Press. This book was released on 2017-07-12 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.

Download or read book 21st International Reliability Physics Symposium written by and published by . This book was released on 1983 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: