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Download or read book 1996 International Integrated Reliability Workshop Final Report written by and published by . This book was released on 1996 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 1996 International Integrated Reliability Workshop Final Report written by IEEE Electron Devices Society and published by IEEE. This book was released on 1997 with total page 175 pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. The 1996 Final Report includes papers, abstracts, and summaries from the conference.

Download or read book 1996 IEEE International Integrated Reliability Workshop Final Report written by IEEE, Electron Devices Society and Reliability Society Staff and published by . This book was released on 1997 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

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Download or read book Composite Materials written by Deborah D.L. Chung and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: Composite Materials is a modern reference book, tutorial in style, covering functions of composites relating to applications in electronic packaging, thermal management, smart structures and other timely technologies rarely covered in existing books on composites. It also treats materials with polymer, metal, cement, carbon and ceramics matrices, contrasting with others that emphasise polymer-matrix composites. This functional approach will be useful to both practitioners and students. A good selection of example problems, solutions and figures, together with a new and vibrant approach, provides a valuable reference source for all engineers working with composite materials.

Download or read book Hot Carrier Degradation in Semiconductor Devices written by Tibor Grasser and published by Springer. This book was released on 2014-10-29 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.