Download or read book Integrated Reliability Workshop Final Report 1993 International written by and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1993 International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2000 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2004 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book International Integrated Reliability Workshop Final Report written by and published by . This book was released on 2005 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and published by . This book was released on with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1995 International Integrated Reliability Workshop Final Report written by and published by . This book was released on 1996 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1999 IEEE International Integrated Reliability Workshop Final Report written by International Integrated Reliability Workshop and published by . This book was released on 1999 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Integrated Reliability Workshop Final Report 2007 IEEE International written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1996 International Integrated Reliability Workshop Final Report written by and published by . This book was released on 1996 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1996 International Integrated Reliability Workshop Final Report written by IEEE Electron Devices Society and published by IEEE. This book was released on 1997 with total page 175 pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. The 1996 Final Report includes papers, abstracts, and summaries from the conference.
Download or read book 1996 IEEE International Integrated Reliability Workshop Final Report written by IEEE, Electron Devices Society and Reliability Society Staff and published by . This book was released on 1997 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Final report written by and published by . This book was released on 1994 with total page 155 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1999 IEEE International Integrated Reliability Workshop Final Report written by IEEE Electron Devices Society and published by IEEE. This book was released on 1999 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text constitutes the final report produced from the IEEE International Integrated Reliability Workshop, which took part in 1999.
Download or read book Final report written by and published by . This book was released on 1996 with total page 172 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2015-03-02 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
Download or read book Electromigration in Metals written by Paul S. Ho and published by Cambridge University Press. This book was released on 2022-05-12 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.