Download or read book 18th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Download or read book 18th IEEE VLSI Test Symposium written by and published by . This book was released on 2000 with total page 478 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 2018 IEEE 36th VLSI Test Symposium VTS written by IEEE Staff and published by . This book was released on 2018-04-22 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems
Download or read book VLSI SoC Opportunities and Challenges Beyond the Internet of Things written by Michail Maniatakos and published by Springer. This book was released on 2019-05-16 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, held in Abu Dhabi, United Arab Emirates, in August 2017. The 11 papers included in this book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design. On the occasion of the silver jubilee of the VLSI-SoC conference series the book also includes a special chapter that presents the history of the VLSI-SoC series of conferences and its relation with VLSI-SoC evolution since the early 80s up to the present.
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2004 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Availability and Serviceability of Networks on Chip written by Érika Cota and published by Springer Science & Business Media. This book was released on 2011-09-23 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Download or read book 2017 IEEE 35th VLSI Test Symposium VTS written by IEEE Staff and published by . This book was released on 2017-04-09 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems
Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Download or read book 2022 IEEE 40th VLSI Test Symposium VTS written by and published by . This book was released on 2022 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 2023 IEEE 41st VLSI Test Symposium VTS written by and published by . This book was released on 2023 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book New Methods of Concurrent Checking written by Michael Gössel and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.
Download or read book Invasive Tightly Coupled Processor Arrays written by VAHID LARI and published by Springer. This book was released on 2016-07-08 with total page 149 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces new massively parallel computer (MPSoC) architectures called invasive tightly coupled processor arrays. It proposes strategies, architecture designs, and programming interfaces for invasive TCPAs that allow invading and subsequently executing loop programs with strict requirements or guarantees of non-functional execution qualities such as performance, power consumption, and reliability. For the first time, such a configurable processor array architecture consisting of locally interconnected VLIW processing elements can be claimed by programs, either in full or in part, using the principle of invasive computing. Invasive TCPAs provide unprecedented energy efficiency for the parallel execution of nested loop programs by avoiding any global memory access such as GPUs and may even support loops with complex dependencies such as loop-carried dependencies that are not amenable to parallel execution on GPUs. For this purpose, the book proposes different invasion strategies for claiming a desired number of processing elements (PEs) or region within a TCPA exclusively for an application according to performance requirements. It not only presents models for implementing invasion strategies in hardware, but also proposes two distinct design flavors for dedicated hardware components to support invasion control on TCPAs.
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Industrial Applications of Evolutionary Algorithms written by Ernesto Sanchez and published by Springer Science & Business Media. This book was released on 2012-01-28 with total page 137 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Industrial applications of evolutionary algorithms" is intended as a resource for both experienced users of evolutionary algorithms and researchers that are beginning to approach these fascinating optimization techniques. Experienced users will find interesting details of real-world problems, advice on solving issues related to fitness computation or modeling, and suggestions on how to set the appropriate parameters to reach optimal solutions. Beginners will find a thorough introduction to evolutionary computation, and a complete presentation of several classes of evolutionary algorithms exploited to solve different problems. Inside, scholars will find useful examples on how to fill the gap between purely theoretical examples and industrial problems. The collection of case studies presented is also extremely appealing for anyone interested in Evolutionary Computation, but without direct access to extensive technical literature on the subject. After the introduction, each chapter in the book presents a test case, and is organized so that it can be read independently from the rest: all the information needed to understand the problem and the approach is reported in each part. Chapters are grouped by three themes of particular interest for real-world applications, namely prototype-based validation, reliability and test generation. The authors hope that this volume will help to expose the flexibility and efficiency of evolutionary techniques, encouraging more companies to adopt them; and that, most of all, you will enjoy your reading.
Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Download or read book Proceedings of Seventh International Conference on Bio Inspired Computing Theories and Applications BIC TA 2012 written by Jagdish C. Bansal and published by Springer Science & Business Media. This book was released on 2012-12-04 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is a collection of high quality peer reviewed research papers presented in Seventh International Conference on Bio-Inspired Computing (BIC-TA 2012) held at ABV-IIITM Gwalior, India. These research papers provide the latest developments in the broad area of "Computational Intelligence". The book discusses wide variety of industrial, engineering and scientific applications of nature/bio-inspired computing and presents invited papers from the inventors/originators of novel computational techniques.
Download or read book System level Test and Validation of Hardware Software Systems written by Matteo Sonza Reorda and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
